MT29F4G08ABBDAH4:D Micron Technology Inc, MT29F4G08ABBDAH4:D Datasheet - Page 87
MT29F4G08ABBDAH4:D
Manufacturer Part Number
MT29F4G08ABBDAH4:D
Description
MICMT29F4G08ABBDAH4:D 4G SLC NAND FLASH
Manufacturer
Micron Technology Inc
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LOCK TIGHT (2Ch)
Figure 61: LOCK TIGHT Operation
PDF: 09005aef83b25735
m60a_4gb_nand.pdf – Rev. J 9/11 EN
The LOCK TIGHT (2Ch) command prevents locked blocks from being unlocked and al-
so prevents unlocked blocks from being locked. When this command is issued, the UN-
LOCK (23h) and LOCK (2Ah) commands are disabled. This provides an additional level
of protection against inadvertent PROGRAM and ERASE operations to locked blocks.
To implement LOCK TIGHT in all of the locked blocks in the device, verify that WP# is
HIGH and then issue the LOCK TIGHT (2Ch) command.
When a PROGRAM or ERASE operation is issued to a locked block that has also been
locked tight, R/B# goes LOW for
complete. The READ STATUS (70h) command reports bit 7 as 0, indicating that the
block is protected. PROGRAM and ERASE operations complete successfully to blocks
that were not locked at the time the LOCK TIGHT command was issued.
After the LOCK TIGHT command is issued, the command cannot be disabled via a soft-
ware command. The only ways to disable the lock tight status is to power cycle the de-
vice. When the lock tight status is disabled, all of the blocks become locked, the same as
if the LOCK (2Ah) command had been issued.
The LOCK TIGHT (2Ch) command is disabled if LOCK is LOW at power-on.
LOCK
WP#
WE#
R/B#
I/Ox
CE#
CLE
LOCK TIGHT
command
2Ch
4Gb, 8Gb, 16Gb: x8, x16 NAND Flash Memory
87
t
LBSY. The PROGRAM or ERASE operation does not
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2009 Micron Technology, Inc. All rights reserved.
Block Lock Feature
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