MG74K Oki Semiconductor, MG74K Datasheet - Page 18

• Manufacturer Part Number: MG74K
• Description: 0.15?m Customer Structured Array
• Manufacturer: Oki Semiconductor

IEEE JTAG Boundary Scan Support
Boundary scan offers efficient board-level and chip-level testing capabilities. Benefits resulting from
incorporating boundary-scan logic into a design include:
Oki’s boundary scan methodology meets the JTAG Boundary Scan standard, IEEE 1149.1-1990. Oki sup-
ports boundary scan on Customer Structured Array (CSA) ASIC technologies. Either the customer or Oki
can perform boundary-scan insertion. More information is available in Oki’s JTAG Boundary Scan Appli-
cation Note. (Contact the Oki Application Engineering Department for interface options.)
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• Improved chip-level and board-level testing and failure diagnostic capabilities
• Support for testing of components with limited probe access
• Easy-to-maintain testability and system self-test capability with on-board software
• Capability to fully isolate and test components on the scan path
• Built-in test logic that can be activated and monitored
• An optional Boundary Scan Identification (ID) Register
MG74K/75K/76K
Oki Semiconductor
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