MT54W1MH18B Micron Semiconductor Products, Inc., MT54W1MH18B Datasheet

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MT54W1MH18B

Manufacturer Part Number
MT54W1MH18B
Description
18Mb Qdrii SRAM, 1.8V Vdd, Hstl, 2-Word Burst,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet

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18Mb QDR
2-WORD BURST
Features
• DLL circuitry for accurate output data placement
• Separate independent read and write data ports with
• 100 percent bus utilization DDR READ and WRITE
• Fast clock to valid data times
• Full data coherency, providing most current data
• Two-tick burst counter for low DDR transaction size
• Double data rate operation on read and write ports
• Two input clocks (K and K#) for precise DDR timing at
• Two output clocks (C and C#) for precise flight time
• Optional-use echo clocks (CQ and CQ#) for flexible
• Single address bus
• Simple control logic for easy depth expansion
• Internally self-timed, registered writes
• Core V
• Clock-stop capability with µs restart
• 13mm x 15mm, 1mm pitch, 11 x 15 grid FBGA package
• User-programmable impedance output
• JTAG boundary scan
NOTE
18Mb: 1.8V V
MT54W1MH18B_H.fm – Rev. H, Pub. 3/03
Options
• Clock Cycle Timing
• Configurations
• Package
• Operating Temperature Range
1. A Part Marking Guide for the FBGA devices can be found on
concurrent transactions
operation
clock rising edges only
and clock skew matching—clock and data delivered
together to receiving device
receive data synchronization
(±0.1V) HSTL
Micron’s Web site—http://www.micron.com/numberguide.
4ns (250 MHz)
5ns (200 MHz)
6ns (167 MHz)
7.5ns (133 MHz)
2 Meg x 8
1 Meg x 18
165-ball, 13mm x 15mm FBGA
Commercial (0°C £ T
512K x 36
:
DD
, HSTL, QDRIIb2 SRAM
DD
= 1.8V (±0.1V); I/O V
A
£ +70°C)
DD
II SRAM
Q = 1.5V to V
MT54W512H36B
MT54W1MH18B
MT54W2MH8B
Marking
None
-7.5
-4
-5
-6
F
DD
1
1
2 MEG
Table 1:
General Description
nous, pipelined burst SRAM employs high-speed, low-
power CMOS designs using an advanced 6T CMOS
process.
(double data rate) ports to access the memory array.
The read port has dedicated data outputs to support
READ operations. The write port has dedicated data
inputs to support WRITE operations. This architecture
eliminates the need for high-speed bus turnaround.
Access to each port is accomplished using a common
address bus. Addresses for reads and writes are latched
on rising edges of the K and K# input clocks, respec-
tively. Each address location is associated with two
words that burst sequentially into or out of the device.
Since data can be transferred into and out of the device
on every rising edge of both clocks (K and K# and C
and C#), memory bandwidth is maximized and system
design is simplified by eliminating bus turnarounds.
MT54W2MH8B
MT54W1MH18B
MT54W512H36B
PART NUMBER
MT54W2MH8BF-xx
MT54W1MH18BF-xx
MT54W512H36BF-xx
The Micron
The QDR architecture consists of two separate DDR
1.8V V
X
Figure 1: 165-Ball FBGA
8, 1 MEG
DD
®
Valid Part Numbers
QDR™II (Quad Data Rate™) synchro-
, HSTL, QDRIIb2 SRAM
DESCRIPTION
2 Meg x 8, QDRIIb2 FBGA
1 Meg x 18, QDRIIb2 FBGA
512K x 36, QDRIIb2 FBGA
X
18, 512K
©2003 Micron Technology, Inc.
X
36

Related parts for MT54W1MH18B

MT54W1MH18B Summary of contents

Page 1

... Operating Temperature Range Commercial (0°C £ T £ +70°C) A NOTE : 1. A Part Marking Guide for the FBGA devices can be found on Micron’s Web site—http://www.micron.com/numberguide. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG MT54W2MH8B II SRAM MT54W1MH18B MT54W512H36B Table 1: PART NUMBER MT54W2MH8BF-xx DD ...

Page 2

... V , HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V READ cycles are pipelined. The request is initiated by asserting R# LOW at K rising edge. Data is delivered after the next rising edge of the next 1), using C and C# as the output timing references ...

Page 3

... Circuitry 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V automatically resets the DLL when the absence of input clock is detected. See Micron Technical Note TN- 54-02 for more information on clock DLL start-up pro- cedures ...

Page 4

... For 2 Meg 20 NWx separate nibble writes. For 1 Meg 18; BWx separate byte writes. For 512K 36; BWx separate byte writes. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Figure 2: Functional Block Diagram 2 Meg Meg x 18; 512K ...

Page 5

... For high frequency applications (200 MHz and faster) the CQ and CQ# clocks (for data capture) are recommended over the C and C# clocks (for data alignment). The C and C# clocks are optional use inputs. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Figure 3: Application Example SRAM # 250Ω ...

Page 6

... TDO TCK NOTE : 1. Expansion address: 2A for 72Mb 2. NW1# controls writes to D4:D7 3. Expansion address: 7A for 144Mb 4. Expansion address: 10A for 36Mb 5. Expansion address: 5B for 288Mb 6. NW0# controls writes to D0:D3 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1. NW1 ...

Page 7

... TCK NOTE : 1. Expansion address: 2A for 144Mb 2. Expansion address: 3A for 36Mb 3. BW1# controls writes to D9:D17 4. Expansion address: 7A for 288Mb 5. Expansion address: 10A for 72Mb 6. BW0# controls writes to D0:D8 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1. BW1 ...

Page 8

... Expansion address is 3A for 72Mb 3. BW2# controls writes to D18:D26 4. BW1# controls writes to D9:D17 5. Expansion address is 9A for 36Mb 6. Expansion address is 10A for 144Mb 7. BW3# controls writes to D27:D35 8. BW0# controls writes to D0:D8 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1. ...

Page 9

... See Ball Layout figures for ball site location of individual signals. The x8 device uses Q0:Q7. Remaining signals are NC. The x18 device uses Q0:Q17. Remaining signals are NC. The x36 device uses Q0:Q35. Remaining signals are NC. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG X X 1.8V V ...

Page 10

... Power Supply: GND – No Connect: These balls are internally connected to the die, but have no function and may be left not connected to the board to minimize ball count. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG HSTL, QDRIIb2 SRAM DD DESCRIPTION Micron Technology, Inc ...

Page 11

... Bus cycle is terminated at the end of this sequence (burst count = 2). 2. State transitions (R# = LOW (W# = LOW). 3. Read and write state machines can be simultaneously active. 4. State machine, control timing sequence is controlled by K. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Figure 4: Bus Cycle State Diagram RD RD ...

Page 12

... This table illustrates operation for x18 devices. The x36 device operation is similar, except for the addition of BW2# (controls D18:D26) and BW3# (controls D27:D35). The x8 operation is similar, except that NW0# controls D0:D3, and NW1# controls D4:D7. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG X 1. ...

Page 13

... Notes appear following parameter tables on page 16; 0°C £ T DESCRIPTION Input High (Logic 1) Voltage Input Low (Logic 0) Voltage 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to ..... -0.5V to +2.8V SS the device ...

Page 14

... Output Capacitance (Q) Clock Capacitance Table 12: Thermal Resistance Note 13; notes appear following parameter tables on page 16 DESCRIPTION Junction to Ambient (Airflow of 1m/s) Junction to Case (Top) Junction to Balls (Bottom) 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V £ +70° SYM TYP ³ Cycle IL ...

Page 15

... Control inputs valid to K rising edge Data-in valid rising edge Hold Times K rising edge to address hold K rising edge to control inputs hold K, K# rising edge to data-in hold 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1. SYMBOL MIN MAX MIN MAX t 4 ...

Page 16

... Typical values are measured at V 1.5V, and temperature = 25°C. 11. NOP currents are valid when entering NOP after all pending READ and WRITE cycles are com- pleted. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1. 12. Average I/O current and power is provided for OH informational purposes only and is not tested ...

Page 17

... Input rise and fall times . . . . . . . . . . . . . . . . . . . . 0.7ns Input timing reference levels . . . . . . . . . . . . . . . . 0.75V Output reference levels . . . . . . . . . . . . . . . . . . .V ZQ for 50 W impedance . . . . . . . . . . . . . . . . . . . . . 250 W Output load . . . . . . . . . . . . . . . . . . . . . . . . . See Figure 5 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG X 1. HSTL, QDRIIb2 SRAM DD Output Load Equivalent ...

Page 18

... Outputs are disabled (High-Z) one clock cycle after a NOP this example, if address A0 = A1, then data Q00 = D10 and Q01 = D11. Write data is forwarded immediately as read results. (This note applies to whole diagram.) 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Figure 6: READ/WRITE Timing WRITE ...

Page 19

... The 0/1 next to each state represents the value of TMS at the rising edge of TCK. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Test Access Port (TAP) Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK ...

Page 20

... Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Shift-DR state. The EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can be used to capture the contents of the I/O ring. ...

Page 21

... SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruc- tion. The PRELOAD portion of this instruction is not implemented, so the device TAP controller is not fully 1149.1-compliant. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG HSTL, QDRIIb2 SRAM DD Note that since the PRELOAD part of the command ...

Page 22

... CS and CH refer to the setup and hold time requirements of latching data from the boundary scan register. 2. Test conditions are specified using the load in Figure 10. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG X 1.8V V Figure 9: TAP Timing THTL ...

Page 23

... This table defines DC values for TAP control and data balls only. The DQ SRAM balls used in JTAG operation will have the DC values as defined in Table 8, “DC Electrical Characteristics and Operating Conditions,” on page 13. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V TAP AC Output Load Equivalent to 1.8V ...

Page 24

... Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operations. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V DESCRIPTION 000 Revision number. def = 001 for 18Mb density for x36 width ...

Page 25

... V , HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 8, 1 MEG X 1. HSTL, QDRIIb2 SRAM DD BIT# FBGA BALL 37 10D 10C 40 11D 11B 44 11C 10B ...

Page 26

... S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900 E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992 Micron, the M logo, and the Micron logo are trademarks and/or service marks of of Micron Technology, Inc. 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG 1.8V V Figure 11: 165-Ball FBGA 0.12 C ...

Page 27

... Rev. 3, Pub. 12/01, ADVANCE .......................................................................................................................................12/01 • Changed AC timing Rev. 2, Pub. 11/01, ADVANCE .......................................................................................................................................11/01 • New ADVANCE data sheet 18Mb: 1. HSTL, QDRIIb2 SRAM DD MT54W1MH18B_H.fm – Rev. H, Pub. 3/03 2 MEG X 1.8V V test conditions for read to write ratio DD Micron Technology, Inc., reserves the right to change products or specifications without notice. ...

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