am49lv128bm Meet Spansion Inc., am49lv128bm Datasheet - Page 13

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am49lv128bm

Manufacturer Part Number
am49lv128bm
Description
Stacked Multi-chip Package Mcp ,128 Megabit 8 M ? 16-bit ,uniform Sector Flash Memory And 32 Mbit 2 M ? 16-bit Pseudo-static Ram With Page Mode Featuring Mirrorbit Technology,supplemental Datasheet
Manufacturer
Meet Spansion Inc.
Datasheet

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AM49LV128BM
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Page Mode Read
The device is capable of fast page mode read and is
compatible with the page mode Mask ROM read oper-
ation. This mode provides faster read access speed
for random locations within a page. The page size of
the device is 4 words. The appropriate page is se-
lected by the higher address bits A(max)–A2. Address
bits A1–A0 determine the specific word within a page.
This is an asynchronous operation; the microproces-
sor supplies the specific word location.
The random or initial page access is equal to t
t
the locations specified by the microprocessor falls
within that page) is equivalent to t
deasserted and reasserted for a subsequent access,
the access time is t
cesses are obtained by keeping the “read-page ad-
dresses” constant and changing the “intra-read page”
addresses.
Writing Commands/Command Sequences
To write a command or command sequence (which in-
cludes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to V
The device features an Unlock Bypass mode to facili-
tate faster programming. Once the device enters the
Unlock Bypass mode, only two write cycles are re-
quired to program a word or byte, instead of four. The
“Word Program Command Sequence” section has de-
tails on programming data to the device using both
standard and Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sec-
tors, or the entire device. Table 2 indicates the address
space that each sector occupies.
Refer to the DC Characteristics table for the active
current specification for the write mode. The AC Char-
acteristics section contains timing specification tables
and timing diagrams for write operations.
Write Buffer
Write Buffer Programming allows the system write to a
maximum of 16 words in one programming operation.
This results in faster effective programming time than
the standard programming algorithms. See “Write
Buffer” for more information.
Accelerated Program Operation
The device offers accelerated program operations
through the ACC function. This is one of two functions
provided by the WP#/ACC pin. This function is prima-
rily intended to allow faster manufacturing throughput
at the factory.
June 17, 2004
CE
and subsequent page read accesses (as long as
IL
, and OE# to V
ACC
IH
or t
.
CE
. Fast page mode ac-
PACC
. When CE# is
ACC
Am49LV128BM
or
If the system asserts V
matically enters the aforementioned Unlock Bypass
mode, temporarily unprotects any protected sectors,
and uses the higher voltage on the pin to reduce the
time required for program operations. The system
would use a two-cycle program command sequence
as required by the Unlock Bypass mode. Removing
V
mal operation. Note that the WP#/ACC pin must not
be at V
gramming, or device damage may result. WP# has an
internal pullup; when unconnected, WP# is at V
Autoselect Functions
If the system writes the autoselect command se-
quence, the device enters the autoselect mode. The
system can then read autoselect codes from the inter-
nal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in
this mode. Refer to the Autoselect Mode and Autose-
lect Command Sequence sections for more informa-
tion.
Standby Mode
When the system is not reading or writing to the de-
vice, it can place the device in the standby mode. In
this mode, current consumption is greatly reduced,
and the outputs are placed in the high impedance
state, independent of the OE# input.
The device enters the CMOS standby mode when the
CE# and RESET# pins are both held at V
(Note that this is a more restricted voltage range than
V
within V
mode, but the standby current will be greater. The de-
vice requires standard access time (t
cess when the device is in either of these standby
modes, before it is ready to read data.
If the device is deselected during erasure or program-
ming, the device draws active current until the
operation is completed.
Refer to the DC Characteristics table for the standby
current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device en-
ergy consumption. The device automatically enables
this mode when addresses remain stable for t
30 ns. The automatic sleep mode is independent of
the CE#, WE#, and OE# control signals. Standard ad-
dress access timings provide new data when ad-
dresses are changed. While in sleep mode, output
data is latched and always available to the system.
Refer to the DC Characteristics table for the automatic
sleep mode current specification.
HH
IH
.) If CE# and RESET# are held at V
from the WP#/ACC pin returns the device to nor-
HH
IO
for operations other than accelerated pro-
± 0.3 V, the device will be in the standby
HH
on this pin, the device auto-
CE
) for read ac-
IH
IO
, but not
± 0.3 V.
IH
ACC
.
11
+

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