ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 4
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ne56632-xx
Manufacturer Part Number
ne56632-xx
Description
Active-low System Reset With Adjustable Delay Time
Manufacturer
NXP Semiconductors
Datasheet
1.NE56632-XX.pdf
(15 pages)
1. t
2. t
3. See Table 1.
Philips Semiconductors
ELECTRICAL CHARACTERISTICS
T
NOTES:
Table 1. NE56632-XX series typical delay time
2003 Oct 14
amb
SYMBOL
V
V
V
V
I
I
I
t
t
V
I
I
–XX
46
45
44
43
42
31
30
29
28
27
20
19
LO
CCL
CCH
PLH
PHL
OL1
OL2
S
hys
S
OL
OPL
Active-LOW system reset with adjustable delay time
/ T
PLH
PHL
= 25 C, unless otherwise specified.
: V
: V
CC
CC
Detection threshold
Hysteresis voltage
Detection threshold voltage
temperature coefficient
LOW-level output voltage
Output leakage current
Supply current (ON time)
Supply current (OFF time)
LOW-to-HIGH delay time
HIGH-to-LOW delay time
Minimum operating
threshold voltage
Output current (ON Time 1)
Output current (ON Time 2)
= (V
= (V
S(typ)
S(typ)
PARAMETER
t
195 ms
190 ms
185 ms
180 ms
175 ms
120 ms
115 ms
110 ms
105 ms
100 ms
65 ms
60 ms
PLH
– 0.4 V) to (V
+ 0.4 V) to (V
S(typ)
S(typ)
R
V
+ 0.4 V); t
– 0.4 V); t
V
V
L
CC1
CC1
V
t
140 s
140 s
140 s
140 s
140 s
120 s
120 s
120 s
100 s
100 s
100 s
100 s
CC
= 4.7 k ; V
PHL
CC1
R
V
V
C
C
= V
CC2
L
= HIGH-to-LOW; R
CC1
= V
V
V
L
L
= 4.7 k ; T
= V
O
O
= 100 pF; R
= 100 pF; R
S(min)
PLH
PHL
CC2
= 0.4 V; S2 = ON; Test Circuit 1 (Figure 27)
= 0.4 V; R
= 0.4 V; R
= V
Test Circuit 1 (Figure 27)
Test Circuit 1 (Figure 27)
R
T
S(typ)
amb
L
S(min)
= 4.7 k ; V
is release delay time (Test Circuit 2, Figure 28).
is assertion delay time (Test Circuit 2, Figure 28).
= 10 V; S2 = ON; Test Circuit 1 (Figure 27)
CC
– 0.05 V; R
CONDITIONS
= –20 C to +75 C; S2 = ON;
Test Circuit 1 (Figure 27)
Test Circuit 1 (Figure 27)
/0.85; R
Test Circuit 1 (Figure 27)
Test Circuit 1 (Figure 27)
V
V
= LOW-to-HIGH-to-LOW; S1 = ON; Test
OL
amb
Circuit 1 (Figure 27)
– 0.05 V; R
L
L
L
L
= 0; V
= 0; V
= 4.7 k ; C
= 4.7 k ; C
= –20 C to +75 C; S1 = ON;
0 4 V
0.4 V;
L
L
OL
= ; Test Circuit 1 (Figure 27)
L
= 4.7 k ; S1=ON;
4
CC1
CC1
= ; Test Circuit 1 (Figure 27)
0.4 V; S1 = ON;
L
= V
= V
= 4.7 k ; S1 = ON;
D
D
= 10 nF (Note 1)
= 10 nF (Note 2)
S(min)
S(min)
– 0.05 V;
– 0.05 V;
-XX
46
45
44
43
42
31
30
29
28
27
20
19
4.531
4.432
4.334
4.235
4.137
3.053
2.955
2.856
2.758
2.659
1.970
1.871
MIN.
25
–
–
–
–
–
–
–
–
5
3
(Note 3)
(Note 3)
4.600
4.500
4.400
4.300
4.200
3.100
3.000
2.900
2.800
2.700
2.000
1.900
TYP.
0.65
0.01
0.2
5.0
3.0
50
NE56632-XX
–
–
–
MAX.
4.669
4.568
4.466
4.365
4.263
3.147
3.045
2.944
2.842
2.741
2.030
1.929
0.80
100
0.4
9.0
5.0
0.1
–
–
–
–
–
Product data
UNIT
%/ C
mV
mA
mA
ms
V
V
V
V
V
V
V
V
V
V
V
V
V
V
A
A
A
s