A1240A-1CQ256B ACTEL [Actel Corporation], A1240A-1CQ256B Datasheet - Page 8

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A1240A-1CQ256B

Manufacturer Part Number
A1240A-1CQ256B
Description
HiRel FPGAs
Manufacturer
ACTEL [Actel Corporation]
Datasheet
A ct e l M I L - ST D - 88 3 Pr od uc t F l ow
8
Step
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
Note:
When Destructive Physical Analysis (DPA) is performed on Class B devices, the step coverage requirement as specified in Method 2018
must be waived.
Screen
Internal Visual
Temperature Cycling
Constant Acceleration
Seal
a. Fine
b. Gross
Visual Inspection
Pre-Burn-In
Electrical Parameters
Burn-in Test
Interim (Post-Burn-In)
Electrical Parameters
Percent Defective Allowable
Final Electrical Test
a. Static Tests
b. Functional Tests
c. Switching Tests at 25°C
External Visual
(1) 25°C
(2) –55°C and +125°C
(1) 25°C
(2) –55°C and +125°C
(Subgroup 9, Table I)
(Subgroup 1, Table I)
(Subgroups 2, 3, Table I)
(Subgroup 7, Table I)
(Subgroups 8A and 8B, Table I)
883 Method
2010, Test Condition B
1010, Test Condition C
2001, Test Condition D or E,
Y
1014
2009
In accordance with applicable Actel
device specification
1015, Condition D,
160 hours @ 125°C or 80 hours @ 150°C
In accordance with applicable Actel
device specification
5%
In accordance with applicable Actel
device specification, which includes a, b, and c:
5005
5005
5005
5005
5005
2009
1
, Orientation Only
883—Class B
Requirement
All Lots
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%

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