SSTUG32866EC/G NXP [NXP Semiconductors], SSTUG32866EC/G Datasheet

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SSTUG32866EC/G

Manufacturer Part Number
SSTUG32866EC/G
Description
1.8 V 25-bit 1 : 1 or 14-bit 1 : 2 configurable registered buffer
Manufacturer
NXP [NXP Semiconductors]
Datasheet

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Part Number:
SSTUG32866EC/G,518
Manufacturer:
NXP Semiconductors
Quantity:
10 000
1. General description
2. Features
3. Applications
The SSTUG32866 is a 1.8 V configurable register specifically designed for use on DDR2
memory modules requiring a parity checking function. It is defined in accordance with the
JEDEC standard for the SSTUG32866 registered buffer. The register is configurable
(using configuration pins C0 and C1) to two topologies: 25-bit 1 : 1 or 14-bit 1 : 2, and in
the latter configuration can be designated as Register A or Register B on the DIMM.
The SSTUG32866 accepts a parity bit from the memory controller on its parity bit
(PAR_IN) input, compares it with the data received on the DIMM-independent D-inputs
and indicates whether a parity error has occurred on its open-drain QERR pin
(active LOW). The convention is even parity, that is, valid parity is defined as an even
number of ones across the DIMM-independent data inputs combined with the parity input
bit.
The SSTUG32866 is packaged in a 96-ball, 6
package (13.5 mm
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SSTUG32866
1.8 V 25-bit 1 : 1 or 14-bit 1 : 2 configurable registered buffer
with parity for DDR2-1G RDIMM applications
Rev. 01 — 29 June 2007
Configurable register supporting DDR2 up to 800 MT/s Registered DIMM applications
Configurable to 25-bit 1 : 1 mode or 14-bit 1 : 2 mode
Controlled output impedance drivers enable optimal signal integrity and speed
Meets or exceeds SSTUG32866 JEDEC standard speed performance
Supports up to 550 MHz clock frequency of operation
Optimized pinout for high-density DDR2 module design
Chip-selects minimize power consumption by gating data outputs from changing state
Supports SSTL_18 data inputs
Checks parity on the DIMM-independent data inputs
Partial parity output and input allows cascading of two SSTUG32866s for correct parity
error processing
Differential clock (CK and CK) inputs
Supports LVCMOS switching levels on the control and RESET inputs
Single 1.8 V supply operation (1.7 V to 2.0 V)
Available in 96-ball, 13.5 mm
400 MT/s to 800 MT/s and higher DDR2 registered DIMMs desiring parity checking
functionality
5.5 mm).
5.5 mm, 0.8 mm ball pitch LFBGA package
16 grid, 0.8 mm ball pitch LFBGA
Product data sheet

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SSTUG32866EC/G Summary of contents

Page 1

SSTUG32866 1.8 V 25-bit 14-bit configurable registered buffer with parity for DDR2-1G RDIMM applications Rev. 01 — 29 June 2007 1. General description The SSTUG32866 is a 1.8 V configurable register specifically designed ...

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... NXP Semiconductors 4. Ordering information Table 1. Ordering information Type number Solder process SSTUG32866EC/G Pb-free (SnAgCu solder ball compound) SSTUG32866EC/S Pb-free (SnAgCu solder ball compound) 4.1 Ordering options Table 2. Type number SSTUG32866EC/G SSTUG32866EC/S SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable registered buffer with parity ...

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NXP Semiconductors 5. Functional diagram (1) Disabled configuration. Fig 1. Functional diagram of SSTUG32866 Register A configuration with and SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable registered buffer with ...

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NXP Semiconductors RESET CK CK D2, D3, D5, D6 D14 VREF C1 PAR_IN C0 Fig 2. Parity logic diagram for Register A configuration (positive logic SSTUG32866_1 Product data ...

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... NXP Semiconductors 6. Pinning information 6.1 Pinning Fig 3. Pin configuration for LFBGA96 Fig 4. Ball mapping register ( SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable registered buffer with parity SSTUG32866EC/G SSTUG32866EC/S ball A1 index area ...

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NXP Semiconductors Fig 5. Ball mapping Register A ( Fig 6. Ball mapping Register B ( SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable ...

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NXP Semiconductors 6.2 Pin description Table 3. Pin description Symbol Pin GND B3, B4, D3, D4, F3, F4, H3, H4, K3, K4, M3, M4, P3 A4, C3, C4, E3, E4, DD G3, G4, J3, J4, L3, L4, N3, ...

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NXP Semiconductors [3] Data outputs = Q2, Q3, Q5, Q6 Q25 when and Data outputs = Q2, Q3, Q5, Q6 Q14 when and Data ...

Page 9

NXP Semiconductors The device also supports low-power active operation by monitoring both system chip select (DCS and CSR) inputs and will gate the Qn and PPO outputs from changing states when both DCS and CSR inputs are HIGH. If either ...

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NXP Semiconductors Table 5. Parity and standby function table L = LOW voltage level HIGH voltage level don’t care; RESET DCS CSR ...

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... PAR_IN inputs data (Dn), CSR, and V ref PAR_IN inputs data (Dn), CSR, and - PAR_IN inputs [1] RESET, Cn 0.65 [1] RESET [2] CK, CK 0.675 [2] CK, CK 600 - - operating in free air SSTUG32866EC/G 0 SSTUG32866EC/S 0 Rev. 01 — 29 June 2007 SSTUG32866 Typ Max - 2.0 V 0. 0.040 0.040 ref ref ...

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NXP Semiconductors 10. Characteristics Table 8. Characteristics At recommended operating conditions (see Symbol Parameter V HIGH-level output voltage OH V LOW-level output voltage OL I input current I I supply current DD I dynamic operating current per DDD MHz C ...

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NXP Semiconductors Table 9. Timing requirements At recommended operating conditions (see Symbol Parameter f clock frequency clock t pulse width W t differential inputs active time ACT t differential inputs inactive time INACT t setup time su t hold time ...

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NXP Semiconductors 10.1 Timing diagrams RESET DCS CSR D25 Q25 PAR_IN PPO QERR Fig 7. Timing diagram for SSTUG32866 used as a single device SSTUG32866_1 ...

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NXP Semiconductors RESET DCS CSR D14 Q14 PAR_IN PPO QERR (not used) Fig 8. Timing diagram for the first SSTUG32866 ( Register A configuration) device used in pair; C0 ...

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NXP Semiconductors RESET DCS CSR D14 Q14 (1) PAR_IN PPO (not used) QERR (1) PAR_IN is driven from PPO of the first SSTUG32866 device. Fig 9. Timing diagram for the second ...

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NXP Semiconductors 11. Test information 11.1 Parameter measurement information for data output load circuit All input pulses are supplied by generators having the following characteristics: PRR 10 MHz; Z The outputs are measured one at ...

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NXP Semiconductors Fig 13. Voltage waveforms; setup and hold times Fig 14. Voltage waveforms; propagation delay times (clock to output) Fig 15. Voltage waveforms; propagation delay times (reset to output) SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable registered buffer ...

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NXP Semiconductors 11.2 Data output slew rate measurement information All input pulses are supplied by generators having the following characteristics: PRR 10 MHz; Z (1) C Fig 16. Load circuit, HIGH-to-LOW slew measurement Fig 17. ...

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NXP Semiconductors 11.3 Error output load circuit and voltage measurement information All input pulses are supplied by generators having the following characteristics: PRR 10 MHz; Z (1) C Fig 20. Load circuit, error output measurements ...

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NXP Semiconductors Fig 23. Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to 11.4 Partial parity out load circuit and voltage measurement information All input pulses are supplied by generators having the following characteristics: ...

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NXP Semiconductors Fig 26. Partial parity out voltage waveforms; propagation delay times with respect to SSTUG32866_1 Product data sheet 1.8 V DDR2-1G configurable registered buffer with parity LVCMOS RESET output and t are ...

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NXP Semiconductors 12. Package outline LFBGA96: plastic low profile fine-pitch ball grid array package; 96 balls; body 13.5 x 5.5 x 1.05 mm ball A1 index area ...

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NXP Semiconductors 13. Soldering This text provides a very brief insight into a complex technology. A more in-depth account of soldering ICs can be found in Application Note AN10365 “Surface mount reflow soldering description” . 13.1 Introduction to soldering Soldering ...

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NXP Semiconductors 13.4 Reflow soldering Key characteristics in reflow soldering are: • Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to higher minimum peak temperatures (see reducing the process window • Solder paste printing issues including ...

Page 26

NXP Semiconductors Fig 28. Temperature profiles for large and small components For further information on temperature profiles, refer to Application Note AN10365 “Surface mount reflow soldering description” . 14. Abbreviations Table 14. Acronym CMOS DDR DIMM LVCMOS PPO PRR RDIMM ...

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NXP Semiconductors 16. Legal information 16.1 Data sheet status [1][2] Document status Product status Objective [short] data sheet Development Preliminary [short] data sheet Qualification Product [short] data sheet Production [1] Please consult the most recently issued document before initiating or ...

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NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features . . . . . . . . ...

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