CY14E256LA CYPRESS [Cypress Semiconductor], CY14E256LA Datasheet - Page 9

• Manufacturer Part Number: CY14E256LA
• Manufacturer: CYPRESS [Cypress Semiconductor]

Data Retention and Endurance
Capacitance
Thermal Resistance
AC Test Conditions
Input Pulse Levels ..................................................0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <3 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
Document Number: 001-54952 Rev. *F
DATA
NV
C
C
Θ
Θ
10. These parameters are guaranteed by design and are not tested.
IN
OUT
JA
JC
Parameter
Parameter
C
Parameter
R
OUTPUT
5.0 V
[10]
[10]
Thermal resistance
(Junction to ambient)
Thermal resistance
(Junction to case)
Input capacitance
Output capacitance
30 pF
Data retention
Nonvolatile STORE operations
Description
Description
963 Ω
R1
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
T
V
A
CC
512 Ω
Figure 3. AC Test Loads
= 25 °C, f = 1 MHz,
Description
= V
R2
CC
(Typ)
Test Conditions
Test Conditions
OUTPUT
5.0 V
5 pF
963 Ω
44-TSOP II 32-SOIC
R1
41.74
11.90
1,000
Max
Min
20
7
7
CY14E256LA
for tri-state specs
512 Ω
41.55
24.43
R2
Page 9 of 19
Years
Unit
Unit
pF
pF
K
°C/W
°C/W
Unit
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