TE28F008xxx Intel Corporation, TE28F008xxx Datasheet - Page 28

• Manufacturer Part Number: TE28F008xxx
• Description: (TE28F Series) 3 Volt Advanced Boot Block Flash Memory
• Manufacturer: Intel Corporation

28F004/400B3, 28F008/800B3, 28F016/160B3, 28F320B3, 28F640B3
22
Figure 5. Input/Output Reference Waveform
Figure 6. Test Configuration
NOTE: AC test inputs are driven at V
NOTE: See table for component values.
NOTE: C
2. Since each column lists specifications for a different V
3. Automatic Power Savings (APS) reduces I
4. Sampled, not 100% tested.
5. Erase and program are inhibited when V
6. Applying V
V
V
V
Test Configuration
CCQ1
CCQ2
CCQ3
conditions V
voltage listed at the top of each column. V
V
indefinitely. However, V
main blocks and 2500 cycles on the parameter blocks. V
maximum. See
V
Test Configuration Component Values for Worst
PP1
PP
indefinitely. However, V
Standard Test
, V
Standard Test
Standard Test
timing ends, at V
when V
L
PP2,
0.0
V
includes jig capacitance.
CCQ
PP
CC
V
CCQ
Case Speed Conditions
PP3
= 11.4 V–12.6 V during program/erase can only be done for a maximum of 1000 cycles on the
Max, V
Section 3.4
= V
INPUT
and V
CCQ
CCQ
CCQ
PP
PP4.
C
Min.
L
Max, V
/2. Input rise and fall times (10%–90%) <10 ns. Worst case speed conditions are
must be at valid levels for program and erase operations.
50
50
50
(pF)
for details. For read operations or during idle time, a 5 V supply may be applied to
PP
For read operations or during idle time, a 5 V supply may be applied to V
must be at valid levels for program and erase operations.
Device
under
Test
CC
V
CCQ
CCQ
2
14.5 K
Min, and V
R
25 K
16 K
1
( )
for a logic “1” and 0.0V for a logic “0.” Input timing begins, and output
PP
CC
CCR
< V
Max is 3.3 V on 0.25 m 32-Mbit devices.
CCQ
14.5 K
R
to approximately standby levels in static operation.
PPLK
25 K
16 K
2
TEST POINTS
C
( )
Min refer to the maximum or minimum V
L
and not guaranteed outside the valid V
V
CCQ
CC
PP
and V
R
R
may be connected to 12 V for a total of 80 hours
1
2
CCQ
voltage range combination, the test
Out
V
CCQ
2
OUTPUT
CC
PP
or V
ranges of
3UHOLPLQDU\
CCQ
PP
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0580_06