HD64F3437TFI16V Renesas Electronics America, HD64F3437TFI16V Datasheet - Page 406

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HD64F3437TFI16V

Manufacturer Part Number
HD64F3437TFI16V
Description
MCU FLASH 60K 100-TQFP
Manufacturer
Renesas Electronics America
Datasheet

Specifications of HD64F3437TFI16V

Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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18.3.3
An effective way to assure the data holding characteristics of the programmed chips is to bake
them at 150˚C, then screen them for data errors. This procedure quickly eliminates chips with
PROM memory cells prone to early failure.
Figure 18.7 shows the recommended screening procedure.
If a series of write errors occurs while the same PROM programmer is in use, stop programming
and check the PROM programmer and socket adapter for defects.
Please inform Hitachi of any abnormal conditions noted during programming or in screening of
program data after high-temperature baking.
374
Reliability of Programmed Data
Figure 18.7 Recommended Screening Procedure
Bake with power off
125 to 150 C, 24 to 48Hr
Read and check program
Write and verify program
Mount

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