PEF24901HV22XP Lantiq, PEF24901HV22XP Datasheet - Page 86

• Manufacturer Part Number: PEF24901HV22XP
• Manufacturer: Lantiq

Specifications of PEF24901HV22XP

• Control Interface: HDLC
• Lead Free Status / Rohs Status: Compliant

Code
0011
0100
0101
1111
EXTEST is used to examine the board interconnections.
When the TAP controller is in the state "update DR", all output pins are updated with the
falling edge of TCK. When it has entered state "capture DR" the levels of all input pins
are latched with the rising edge of TCK. The in/out shifting of the scan vectors is typically
done using the instruction SAMPLE/PRELOAD.
INTEST supports internal chip testing.
When the TAP controller is in the state "update DR", all inputs are updated internally with
the falling edge of TCK. When it has entered state "capture DR" the levels of all outputs
are latched with the rising edge of TCK. The in/out shifting of the scan vectors is typically
done using the instruction SAMPLE/PRELOAD.
0001 (INTEST) is the default value of the instruction register.
SAMPLE/PRELOAD provides a snap-shot of the pin level during normal operation or is
used to preload (TDI) / shift out (TDO) the boundary scan with a test vector. Both
activities are transparent to the system functionality.
IDCODE Register
The 32-bit identification register is serially read out via TDO. It contains the version
number (4 bits), the device code (16 bits) and the manufacturer code (11 bits). The LSB
is fixed to "1".
Note: In the state "test logic reset" the code "0011" is loaded into the instruction code
CLAMP allows the state of the signals included in the boundary scan driven from the
PEF 24901 to be determined from the boundary scan register while the bypass register
is selected as the serial path between TDI and TDO. These output signals driven from
the DFE-T V2.2 will not change while CLAMP is selected.
HIGHZ sets all output pins included to the boundary scan path into a high impedance
state. In this state, an in-circuit test system may drive signals onto the connections
Data Sheet
Version
0001
register.
Instruction
IDCODE
CLAMP
HIGHZ
BYPASS
0000 0000 0110 0111
Device Code
Function
Bypass operation
Reading ID code
Reading outputs
Z-State of all boundary scan output pins
87
Manufacturer Code
0000 1000 001
Operational Description
1
Output
PEF 24901
TDO
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2002-09-30
DFE-T