PIC18F2510-E/SP Microchip Technology, PIC18F2510-E/SP Datasheet - Page 250
![IC MCU FLASH 16KX16 28-DIP](/photos/6/59/65908/150-28-dip_sml.jpg)
PIC18F2510-E/SP
Manufacturer Part Number
PIC18F2510-E/SP
Description
IC MCU FLASH 16KX16 28-DIP
Manufacturer
Microchip Technology
Series
PIC® 18Fr
Datasheets
1.PIC16F616T-ISL.pdf
(8 pages)
2.PIC18F2221-ISO.pdf
(46 pages)
3.PIC18LF2410-ISO.pdf
(376 pages)
4.PIC18LF2410-ISO.pdf
(8 pages)
5.PIC18LF2410-ISO.pdf
(16 pages)
6.PIC18LF2410-ISO.pdf
(6 pages)
7.PIC18LF2410-ISO.pdf
(6 pages)
8.PIC18LF2410-ISO.pdf
(8 pages)
Specifications of PIC18F2510-E/SP
Core Processor
PIC
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
25
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
4.2 V ~ 5.5 V
Data Converters
A/D 10x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
28-DIP (0.300", 7.62mm)
For Use With
DVA18XP280 - DEVICE ADAPTER 18F2220 PDIP 28LD
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
- PIC16F616T-ISL PDF datasheet
- PIC18F2221-ISO PDF datasheet #2
- PIC18LF2410-ISO PDF datasheet #3
- PIC18LF2410-ISO PDF datasheet #4
- PIC18LF2410-ISO PDF datasheet #5
- PIC18LF2410-ISO PDF datasheet #6
- PIC18LF2410-ISO PDF datasheet #7
- PIC18LF2410-ISO PDF datasheet #8
- Current page: 250 of 376
- Download datasheet (7Mb)
PIC18F2X1X/4X1X
FIGURE 22-4:
22.4.3
By entering a power-managed mode, the clock
multiplexer selects the clock source selected by the
OSCCON register. Fail-Safe Monitoring of the power-
managed clock source resumes in the power-managed
mode.
If an oscillator failure occurs during power-managed
operation, the subsequent events depend on whether
or not the oscillator failure interrupt is enabled. If
enabled (OSCFIF = 1), code execution will be clocked
by the INTOSC multiplexer. An automatic transition
back to the failed clock source will not occur.
If the interrupt is disabled, subsequent interrupts while
in Idle mode will cause the CPU to begin executing
instructions while being clocked by the INTOSC
source.
DS39636D-page 252
Note:
Sample Clock
CM Output
FSCM INTERRUPTS IN
POWER-MANAGED MODES
OSCFIF
Device
Output
Clock
The device clock is normally at a much higher frequency than the sample clock. The relative frequencies in this
example have been chosen for clarity.
(Q)
FSCM TIMING DIAGRAM
CM Test
22.4.4
The FSCM is designed to detect oscillator failure at any
point after the device has exited Power-on Reset
(POR) or low-power Sleep mode. When the primary
device clock is EC, RC or INTRC modes, monitoring
can begin immediately following these events.
For oscillator modes involving a crystal or resonator
(HS, HSPLL, LP or XT), the situation is somewhat
different. Since the oscillator may require a start-up
time considerably longer than the FCSM sample clock
time, a false clock failure may be detected. To prevent
this, the internal oscillator block is automatically config-
ured as the device clock and functions until the primary
clock is stable (the OST and PLL timers have timed
out). This is identical to Two-Speed Start-up mode.
Once the primary clock is stable, the INTRC returns to
its role as the FSCM source.
As noted in Section 22.3.1 “Special Considerations
for Using Two-Speed Start-up”, it is also possible to
select another clock configuration and enter an
alternate power-managed mode while waiting for the
primary clock to become stable. When the new power-
managed mode is selected, the primary clock is
disabled.
Note:
CM Test
Oscillator
Failure
POR OR WAKE FROM SLEEP
The same logic that prevents false oscilla-
tor failure interrupts on POR or wake from
Sleep, will also prevent the detection of
the oscillator’s failure to start at all follow-
ing these events. This can be avoided by
monitoring the OSTS bit and using a
timing routine to determine if the oscillator
is taking too long to start. Even so, no
oscillator failure interrupt will be flagged.
© 2009 Microchip Technology Inc.
Detected
Failure
CM Test
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