MAX11008BETM+ Maxim Integrated Products, MAX11008BETM+ Datasheet - Page 66

• Manufacturer Part Number: MAX11008BETM+
• Description: RF Wireless Misc IC CTLR LDMOS BIAS DUAL
• Manufacturer: Maxim Integrated Products

Specifications of MAX11008BETM+

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Dual RF LDMOS Bias Controller with
Nonvolatile Memory
Integral nonlinearity (INL) is the deviation of the values
on an actual transfer function from a straight line. This
straight line can be either a best-straight-line fit or a line
drawn between the end points of the transfer function,
once offset and gain errors have been nullified. INL for
the MAX11008 is measured using the end-point
method.
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1 LSB. A DNL
error specification of greater than -1 LSB guarantees no
missing codes and a monotonic transfer function.
For an ideal converter, the first transition occurs at 0.5
LSB, above zero. Offset error is the amount of deviation
between the measured first transition point and the
ideal first transition point.
When a positive full-scale voltage is applied to the con-
verter inputs, the digital output is all ones (FFFh). The
transition from FFEh to FFFh occurs at 1.5 LSB below
full scale. Gain error is the amount of deviation between
the measured full-scale transition point and the ideal
full-scale transition point with the offset error removed.
Aperture delay (t
edge of the sampling clock and the instant when an
actual sample is taken.
For a waveform perfectly reconstructed from digital
samples, signal-to-noise ratio (SNR) is the ratio of full-
scale analog input (RMS value) to the RMS quantization
error (residual error). The ideal, theoretical minimum
analog-to-digital noise is caused by quantization error
Table 27. LUT Streaming Register
66
DATA BITS
______________________________________________________________________________________
D[15:8]
D[7:0]
AD
LUTSA[7:0]
LUTSL[7:0]
BIT NAME
) is the time between the rising
Differential Nonlinearity
Signal-to-Noise Ratio
Integral Nonlinearity
RESET STATE
ADC Offset Error
ADC Gain Error
Aperture Delay
Definitions
0
0
LUT length bits. Specifies the number of data words to be written to the
EEPROM. Up to 256 data words can be written. The actual length written is
LUTSL + 1.
LUT address bits. Specifies the starting address of the data to be written to
the EEPROM.
only and results directly from the ADC’s resolution (N
bits):
In reality, there are other noise sources besides quanti-
zation noise, including thermal noise, reference noise,
clock jitter, etc. Therefore, SNR is calculated by taking
the ratio of the RMS signal to the RMS noise. RMS noise
includes all spectral components to the Nyquist fre-
quency excluding the fundamental, the first five har-
monics, and the DC offset.
Signal-to-noise plus distortion (SINAD) is the ratio of the
fundamental input frequency’s RMS amplitude to the
RMS noise plus distortion. RMS noise plus distortion
includes all spectral components to the Nyquist fre-
quency excluding the fundamental and the DC offset:
Effective number of bits (ENOB) indicates the global
accuracy of an ADC at a specific input frequency and
sampling rate. An ideal ADC’s error consists of quanti-
zation noise only. With an input range equal to the full-
scale range of the ADC, calculate the effective number
of bits as follows:
Total harmonic distortion (THD) is the ratio of the RMS
sum of the first five harmonics of the input signal to the
fundamental itself. This is expressed as:
where V1 is the fundamental amplitude, and V2 through
V6 are the amplitudes of the first five harmonics.
THD
SINAD (dB) = 20 x log (Signal
=
20
x
ENOB = (SINAD - 1.76)/6.02
log
SNR = (6.02 x N + 1.76)dB
Signal-to-Noise Plus Distortion
⎡
⎢
⎢
⎣
FUNCTION
⎛
⎜
⎝
V
2
2
Total Harmonic Distortion
+
Effective Number of Bits
V
3
2
+
V
4
2
RMS
+
/Noise
V
5
2
+
RMS
V
6
2
⎞
⎟
⎠
)
/
V
1
⎤
⎥
⎥
⎦