STM3220G-SK/IAR STMicroelectronics, STM3220G-SK/IAR Datasheet - Page 90

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STM3220G-SK/IAR

Manufacturer Part Number
STM3220G-SK/IAR
Description
DEV KIT STM32F207ZG KICKSTART
Manufacturer
STMicroelectronics
Series
IAR Kickstartr
Type
MCUr
Datasheets

Specifications of STM3220G-SK/IAR

Contents
Hardware, Software and Documentation
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
For Use With/related Products
STM32F207
Other names
497-11404
Electrical characteristics
Table 39.
5.3.15
90/163
Symbol
LU
Electrical sensitivities
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in
Table 40.
Static latch-up class
Symbol
I
INJ
Parameter
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
I/O current injection susceptibility
Injected current on all FT pins
Injected current on any other pin
T
Description
A
Table
= +105 °C conforming to JESD78A
Doc ID 15818 Rev 6
40.
Conditions
Functional susceptibility
Negative
injection
–5
–5
STM32F205xx, STM32F207xx
injection
Positive
+0
+5
II level A
Class
SS
Unit
mA
or

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