STM32F407VGT6 STMicroelectronics, STM32F407VGT6 Datasheet - Page 112

• Manufacturer Part Number: STM32F407VGT6
• Description: IC MCU 32BIT 1MB FLASH 100LQFP
• Manufacturer: STMicroelectronics

Specifications of STM32F407VGT6

• Core Processor: ARM Cortex-M4
• Core Size: 32-Bit
• Speed: 168MHz
• Connectivity: CAN, I²C, IrDA, LIN, SPI, UART/USART, USB OTG
• Peripherals: Brown-out Detect/Reset, DMA, I²S, POR, PWM, WDT
• Number Of I /o: 82
• Program Memory Size: 1MB (1M x 8)
• Program Memory Type: FLASH
• Eeprom Size: -
• Ram Size: 192K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 16x12b, D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: *
• Core: ARM Cortex M4
• Processor Series: STM32F4
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 168 MHz
• Data Ram Size: 192 KB
• On-chip Adc: Yes
• Number Of Programmable I/os: 82
• Number Of Timers: 10
• Operating Supply Voltage: 1.7 V to 3.6 V
• Mounting Style: SMD/SMT
• A/d Bit Size: 12 bit
• A/d Channels Available: 16
• Interface Type: CAN, I2C, I2S, SPI, UART
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 497-11605

Electrical characteristics
5.3.21
Table 66.
1. Based on characterization, not tested in production.
2. Guaranteed by design, not tested in production.
3. Shortest sampling time can be determined in the application by multiple iterations.
5.3.22
Table 67.
1. Guaranteed by design, not tested in production.
2. Shortest sampling time can be determined in the application by multiple iterations.
5.3.23
Table 68.
1. Shortest sampling time can be determined in the application by multiple iterations.
2. Guaranteed by design, not tested in production.
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V
Avg_Slope
T
T
RERINT_s
S_temp
T
t
Symbol
V
S_vrefint
T
t
START
Symbol
START
S_vbat
Coeff
REFINT
V
Symbol
T
25
Er
L
(1)
Q
R
(1)
(1)
(2)
(3)(2)
(2)
(2)
(2)(2)
(1)
(2)
(1)
Embedded internal reference voltage
Temperature sensor characteristics
TS characteristics
V
V
Embedded reference voltage
The parameters given in
temperature and V
Internal reference voltage
ADC sampling time when reading the
internal reference voltage
Internal reference voltage spread over the
temperature range
Temperature coefficient
Startup time
BAT
BAT
V
Average slope
Voltage at 25 °C
Startup time
ADC sampling time when reading the temperature (1 °C accuracy)
SENSE
Resistor bridge for V
Ratio on V
Error on Q
ADC sampling time when reading the V
1 mV accuracy
monitoring characteristics
monitoring characteristics
linearity with temperature
BAT
Parameter
measurement
DD
supply voltage conditions summarized in
BAT
Parameter
Table 68
Parameter
Doc ID 022152 Rev 1
are derived from tests performed under ambient
BAT
–40 °C < T
Conditions
V
DD
A
= 3 V
< +105 °C 1.18
Min
–1
5
-
-
STM32F405xx, STM32F407xx
Table
Min
Min
10
10
-
-
-
-
-
-
-
Typ
50
2
-
-
10.
0.76
Typ
1.21
Typ
2.5
±1
30
6
-
3
6
-
Max
+1
-
-
-
Max
Max
1.24
±2
10
50
10
-
5
-
mV/°C
Unit
ppm/°C
Unit
KΩ
µs
%
°C
µs
µs
Unit
V
mV
µs
µs
V