STM32F407VGT6 STMicroelectronics, STM32F407VGT6 Datasheet - Page 86

IC MCU 32BIT 1MB FLASH 100LQFP

STM32F407VGT6

Manufacturer Part Number
STM32F407VGT6
Description
IC MCU 32BIT 1MB FLASH 100LQFP
Manufacturer
STMicroelectronics
Datasheets

Specifications of STM32F407VGT6

Core Processor
ARM Cortex-M4
Core Size
32-Bit
Speed
168MHz
Connectivity
CAN, I²C, IrDA, LIN, SPI, UART/USART, USB OTG
Peripherals
Brown-out Detect/Reset, DMA, I²S, POR, PWM, WDT
Number Of I /o
82
Program Memory Size
1MB (1M x 8)
Program Memory Type
FLASH
Eeprom Size
-
Ram Size
192K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 16x12b, D/A 2x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Core
ARM Cortex M4
Processor Series
STM32F4
Data Bus Width
32 bit
Maximum Clock Frequency
168 MHz
Data Ram Size
192 KB
On-chip Adc
Yes
Number Of Programmable I/os
82
Number Of Timers
10
Operating Supply Voltage
1.7 V to 3.6 V
Mounting Style
SMD/SMT
A/d Bit Size
12 bit
A/d Channels Available
16
Interface Type
CAN, I2C, I2S, SPI, UART
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
497-11605

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Electrical characteristics
Table 39.
1. TBD stands for “to be defined”.
5.3.14
Table 40.
1. Based on characterization results, not tested in production.
2. On V
86/154
Symbol
V
V
Symbol
S
ESD(HBM)
ESD(CDM)
EMI
BAT
pin, V
Parameter
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC
standard which specifies the test board and the pin loading.
EMI characteristics
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
ESD absolute maximum ratings
Peak level
Electrostatic discharge
voltage (human body
model)
Electrostatic discharge
voltage (charge device
model)
ESD(HBM)
is limited to 1000 V.
Ratings
V
package, conforming to SAE J1752/3
EEMBC, code running with ART
enabled
V
package, conforming to SAE J1752/3
EEMBC, code running with ART
enabled, PLL spread spectrum
enabled
DD
DD
= 3.3 V, T
= 3.3 V, T
®
code, is running. This emission test is compliant with SAE IEC61967-2
(1)
Conditions
A
A
= 25 °C, LQFP176
= 25 °C, LQFP176
T
T
A
A
Doc ID 022152 Rev 1
= +25 °C conforming to JESD22-A114
= +25 °C conforming to JESD22-C101
Conditions
130 MHz to 1GHz
130 MHz to 1GHz
frequency band
SAE EMI Level
30 to 130 MHz
30 to 130 MHz
SAE EMI level
0.1 to 30 MHz
0.1 to 30 MHz
Monitored
STM32F405xx, STM32F407xx
Class
2
II
[f
8/120 MHz
Max vs.
HSE
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
Maximum
/f
value
2000
CPU
500
]
(2)
(1)
dBµV
dBµV
Unit
-
-
Unit
V

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