SAM3SD8B Atmel Corporation, SAM3SD8B Datasheet - Page 48

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SAM3SD8B

Manufacturer Part Number
SAM3SD8B
Description
Manufacturer
Atmel Corporation
Datasheets
11.11 Digital-to-Analog Converter (DAC)
11.12 Static Memory Controller
11.13 Analog Comparator
48
SAM3S8/SD8 Summary
• Single ended/differential conversion
• Programmable gain: 1, 2, 4
• Up to 2 channel 12-bit DAC
• Up to 2 mega-samples conversion rate in single channel mode
• Flexible conversion range
• Multiple trigger sources for each channel
• 2 Sample/Hold (S/H) outputs
• Built-in offset and gain calibration
• Possible to drive output to ground
• Possible to use as input to analog comparator or ADC (as an internal wire and without S/H
• Two PDC channels
• Power reduction mode
• 16-Mbyte Address Space per Chip Select
• 8- bit Data Bus
• Word, Halfword, Byte Transfers
• Byte Write or Byte Select Lines
• Programmable Setup, Pulse And Hold Time for Read Signals per Chip Select
• Programmable Setup, Pulse And Hold Time for Write Signals per Chip Select
• Programmable Data Float Time per Chip Select
• Compliant with LCD Module
• External Wait Request
• Automatic Switch to Slow Clock Mode
• Asynchronous Read in Page Mode Supported: Page Size Ranges from 4 to 32 Bytes
• NAND Flash additional logic supporting NAND Flash with Multiplexed Data/Address buses
• Hardware Configurable number of chip select from 1 to 4
• Programmable timing on a per chip select basis
• One analog comparator
• High speed option vs. low-power option
• Selectable input hysteresis
• Minus input selection:
stage)
– 170 µA/xx ns active current consumption/propagation delay
– 20 µA/xx ns active current consumption/propagation delay
– 0, 20 mV, 50 mV
– DAC outputs
11090AS–ATARM–10-Feb-12

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