pcf2127a NXP Semiconductors, pcf2127a Datasheet - Page 62
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pcf2127a
Manufacturer Part Number
pcf2127a
Description
Integrated Rtc, Tcxo And Quartz Crystal
Manufacturer
NXP Semiconductors
Datasheet
1.PCF2127A.pdf
(79 pages)
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NXP Semiconductors
11. Limiting values
PCF2127A_1
Product data sheet
Table 60.
In accordance with the Absolute Maximum Rating System (IEC 60134).
[1]
[2]
[3]
[4]
[5]
Symbol
V
I
V
I
V
I
V
P
T
V
I
T
DD
I
O
lu
amb
stg
DD
i
O
BAT
tot
ESD
Pass level; Human Body Model (HBM) according to
Pass level; Machine Model (MM), according to
Pass level; Charged-Device Model (CDM), according to
Pass level; latch-up testing according to
According to the NXP store and transport requirements (see
stored at a temperature of +8 °C to +45 °C and a humidity of 25 % to 75 %. For long term storage products
deviant conditions are described in that document.
Limiting values
Parameter
supply voltage
supply current
input voltage
input current
output voltage
output current
battery supply voltage
total power dissipation
ambient temperature
electrostatic discharge
voltage
latch-up current
storage temperature
Rev. 01 — 21 January 2010
Ref. 10 “JESD78”
Conditions
at pin SDA
HBM
MM
CDM
Ref. 8
Integrated RTC, TCXO and quartz crystal
Ref. 7
“JESD22-A115”.
Ref. 9
“JESD22-A114”.
at maximum ambient temperature (T
Ref. 12
“JESD22-C101”.
[1]
[2]
[3]
[4]
[5]
“NX3-00092”) the devices have to be
Min
−0.5
−50
−0.5
−10
−0.5
−10
−10
−0.5
-
−40
-
-
-
-
−55
PCF2127A
© NXP B.V. 2010. All rights reserved.
Max
+4.5
+50
+6.5
+10
+6.5
+10
+20
+4.5
300
+85
±3000
±250
±1500
200
+85
amb(max)
Unit
V
mA
V
mA
V
mA
mA
V
mW
°C
V
V
V
mA
°C
62 of 79
).