pca82c200t NXP Semiconductors, pca82c200t Datasheet - Page 33
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pca82c200t
Manufacturer Part Number
pca82c200t
Description
8-bit Microcontroller With On-chip Can
Manufacturer
NXP Semiconductors
Datasheet
1.PCA82C200T.pdf
(108 pages)
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Philips Semiconductors
Note
1. The Test Register is used for production testing only.
13.5.3
The contents of the Control Register are used to change the behaviour of the CAN-controller. Control bits may be set or
reset by the CPU which uses the Control Register as a read/write memory.
Table 31 Control Register (address 0)
Table 32 Description of the CR bits
1996 Jun 27
Transmit Buffer
A
ID.10
A
ID.2
ADDRESS
Data
Receive Buffer 0 and 1
A
ID.10
A
ID.2
ADDRESS
Data
DDRESS
DDRESS
DDRESS
DDRESS
8-bit microcontroller with on-chip CAN
BIT
TM
7
7
7
6
C
12
22
10: I
11: RTR, D
20: I
21: RTR, D
ONTROL
TO
TO
DENTIFIER
DENTIFIER
ID.9
ID.1
Data
ID.9
ID.1
Data
TM
S
19: B
29: B
SYMBOL
R
EGISTER
S
6
6
ATA
YTES
YTES
ATA
L
L
ENGTH
ENGTH
1
1
TO
TO
(CR)
ID.8
ID.0
Data
ID.8
ID.0
Data
Test Mode (note 1).If the value of TM is:
Sync (note 2). If the value of S is:
8
8
HIGH (enabled), then the CAN-controller enters Test Mode (normal operations
impossible).
LOW (disabled), then the CAN-controller is in normal operating mode.
HIGH (2 edges), then bus-line transitions from recessive-to-dominant and vice-versa
are used for resynchronization (see Sections 13.5.20 and 13.6).
LOW (1 edge), then the only transitions from recessive-to-dominant are used for
resynchronization.
C
C
ODE
ODE
RA
5
5
ID.7
RTR
Data
ID.7
RTR
Data
OIE
4
4
BIT
33
ID.6
DLC.3
Data
ID.6
DLC.3
Data
EIE
3
3
FUNCTION
ID.5
DLC.2
Data
ID.5
DLC.2
Data
TIE
2
2
ID.4
DLC.1
Data
ID.4
DLC.1
Data
RIE
1
1
Product specification
P8xCE598
ID.3
DLC.0
Data
ID.3
DLC.0
Data
RR
0
0
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