mfrc52301hn1-trayb NXP Semiconductors, mfrc52301hn1-trayb Datasheet - Page 67

• Manufacturer Part Number: mfrc52301hn1-trayb
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
MFRC523_33
Product data sheet
PUBLIC
9.2.4.10 TestDAC1Reg register
9.2.4.12 TestADCReg register
9.2.4.13 Reserved register 3Ch
9.2.4.11 TestDAC2Reg register
Defines the test value for TestDAC1.
Table 135. TestDAC1Reg register (address 39h); reset value: xxh bit allocation
Table 136. TestDAC1Reg register bit descriptions
Defines the test value for TestDAC2.
Table 137. TestDAC2Reg register (address 3Ah); reset value: xxh bit allocation
Table 138. TestDAC2Reg register bit descriptions
Shows the values of ADC I and Q channels.
Table 139. TestADCReg register (address 3Bh); reset value: xxh bit allocation
Table 140. TestADCReg register bit descriptions
Functionality reserved for production test.
Bit
Symbol
Access
Bit
7
6
5 to 0
Bit
Symbol
Access
Bit
7 to 6
5 to 0
Bit
Symbol
Access
Bit
7 to 4
3 to 0
Symbol
reserved
reserved
TestDAC1[5:0] defines the test value for TestDAC1
Symbol
reserved
TestDAC2[5:0] defines the test value for TestDAC2
Symbol
ADC_I[3:0]
ADC_Q[3:0]
7
7
7
reserved
reserved
All information provided in this document is subject to legal disclaimers.
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Rev. 3.3 — 5 March 2010
6
6
6
ADC_I[3:0]
Description
reserved for production tests
reserved for future use
output of DAC1 can be routed to AUX1 by setting value
AnalogSelAux1[3:0] to 0001b in the AnalogTestReg register
Description
reserved for future use
output of DAC2 can be routed to AUX2 by setting value
AnalogSelAux2[3:0] to 0001b in the AnalogTestReg register
Description
ADC I channel value
ADC Q channel value
R
115233
5
5
5
4
4
4
TestDAC1[5:0]
TestDAC2[5:0]
3
3
3
R/W
R/W
2
2
2
ADC_Q[3:0]
Contactless reader IC
R
MFRC523
© NXP B.V. 2010. All rights reserved.
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