mfrc52301hn1-trayb NXP Semiconductors, mfrc52301hn1-trayb Datasheet - Page 82

• Manufacturer Part Number: mfrc52301hn1-trayb
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
MFRC523_33
Product data sheet
PUBLIC
16.1.3.2 Example: Output test signals Corr1 and MinLevel
Figure 28
TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the
TestDAC2Reg register is programmed with a rectangular signal defined by values 00h
and 3Fh.
Figure 29
The AnalogTestReg register is set to 24h.
Fig 28. Output test signals TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2
Fig 29. Output test signals Corr1 on pin AUX1 and MinLevel on pin AUX2
(1) TestDAC1 (500 mV/div) on pin AUX1.
(2) TestDAC2 (500 mV/div) on pin AUX2.
(1) MinLevel (1 V/div) on pin AUX2.
(2) Corr1 (1 V/div) on pin AUX1.
(3) RF field.
shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the
shows test signals Corr1 and MinLevel on pins AUX1 and AUX2, respectively.
(1)
(2)
All information provided in this document is subject to legal disclaimers.
Rev. 3.3 — 5 March 2010
115233
(1)
(2)
(3)
Contactless reader IC
100 ms/div
10 μs/div
MFRC523
001aak597
001aak598
© NXP B.V. 2010. All rights reserved.
82 of 98