pxb4340e Infineon Technologies Corporation, pxb4340e Datasheet - Page 79
pxb4340e
Manufacturer Part Number
pxb4340e
Description
Atm Oam Processor Aop
Manufacturer
Infineon Technologies Corporation
Datasheet
1.PXB4340E.pdf
(185 pages)
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Read/write Address B9
Value after reset 0057
Read/write Address BA
Value after reset 002D
Data Sheet
F4F5PROP
IDLEMAX(2:0)
ARDEFMAX(3:0)
SCPTOL(5:0)
SCP(9:0)
Unused
PROP
F4F5
H
IDLEMAX(2:0)
H
Scan cycle tolerance: (maximum time - minimum time) for complete
processing of 1 LCI counted in cell cycles).
Scan cycle period: minimum time for processing of 1 LCI counted in cell
cycles; necessary for equal distribution of OAM cells over 1 scan cycle,
avoids OAM bursts generated by SCAN).
0
Control forced AIS/RDI cell generation (ARINS bit in external RAM)
behaviour at F4TEP:
0
1
Time for transition from AIS defect/failure to normal operation or from
RDI defect/failure to normal operation. Counted in multiples of SCAN
cycles.
Time for transition from AIS defect to AIS failure state or RDI defect to
RDI failure state. Counted in multiples of SCAN cycles.
H
H
SCPTOL(5:0)
Generate ’F4RDI only’ if ARINS is set.
Generate ’F4RDI and F5AIS for all included VCCs if
ARINS is set.
Disables SCAN.
SCP(7:0)
3-79
Unused
ARDEFMAX(3:0)
SCP(9:8)
04.2000
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