k9f1208u0a-y Samsung Semiconductor, Inc., k9f1208u0a-y Datasheet - Page 13

no-image

k9f1208u0a-y

Manufacturer Part Number
k9f1208u0a-y
Description
64m X 8 Bit , 32m X 16 Bit Nand Flash Memory
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
k9f1208u0a-yCB0
Manufacturer:
PANASONIC
Quantity:
8 000
Part Number:
k9f1208u0a-yIB0
Manufacturer:
SAMSUNG
Quantity:
601
K9F1208D0A
K9F1208U0A
VALID BLOCK
NOTE :
1. The
2. The 1st block, which is placed on 00h block address, is guaranteed to be a valid block, does not require Error Correction up to 1K Program/Erase
3. Minimum 1004 valid blocks are guaranteed for each contiguous 128Mb memory space.
AC TEST CONDITION
(K9F12XXX0A-XCB0 :TA=0 to 70 C, K9F12XXX0A-XIB0:TA=-40 to 85 C
CAPACITANCE
NOTE : Capacitance is periodically sampled and not 100% tested.
MODE SELECTION
NOTE : 1. X can be V
Input Pulse Levels
Input Rise and Fall Times
Input and Output Timing Levels
K9F12XXD0A:Output Load (Vcc
K9F12XXU0A:Output Load (Vcc
K9F12XXU0A:Output Load (Vcc
K9F12XXD0A : Vcc=2.4V~2.9V , K9F12XXU0A : Vcc=2.7V~3.6V unless otherwise noted)
Valid Block Number
cycles.
Input/Output Capacitance
Input Capacitance
sented with both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain one or more bad bits
factory-marked bad blocks. Refer to the attached technical notes for a appropriate management of invalid blocks.
CLE
H
H
L
L
L
L
L
X
X
X
X
X
device
2. WP should be biased to CMOS high or CMOS low for standby.
Parameter
ALE
may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid blocks is pre-
X
H
H
X
X
X
X
L
L
L
L
L
Item
(1)
IL
Parameter
or V
(
T
CE
K9F1216D0A
K9F1216U0A
IH.
X
X
X
X
H
L
L
L
L
L
L
L
A
=25 C, V
Q
Q
Q
WE
:2.65V +/-10%)
:3.0V +/-10%)
:3.3V +/-10%)
H
H
X
X
X
X
X
CC
=2.65V/3.3V, f=1.0MHz)
Symbol
Symbol
C
N
C
I/O
VB
RE
IN
H
H
H
H
H
H
H
X
X
X
X
1 TTL GATE and CL=30pF 1 TTL GATE and CL=50pF
0V/V
WP
X
X
H
H
H
X
X
X
H
H
L
Test Condition
K9F12XXD0A
CC
0V to Vcc
(2)
Vcc
V
V
During Read(Busy) on K9F1208U0A-Y,P,V,F or K9F1208D0A-Y,P
During Read(Busy) on the devices except K9F1208U0A-Y,P,V,F or
K9F1208D0A-Y,P
4,026
5ns
IN
Data Input
Data Output
During Program(Busy)
During Erase(Busy)
Write Protect
Stand-by
IL
Min
-
=0V
Q
=0V
Read Mode
Write Mode
/2
13
Q
1 TTL GATE and CL=100pF
Command Input
Address Input(4clock)
Command Input
Address Input(4clock)
Typ.
Min
-
-
-
K9F12XXU0A
0.4V to 2.4V
1.5V
5ns
Mode
FLASH MEMORY
4,096
Max
Max
10
10
.
Do not erase or program
Blocks
Unit
Unit
pF
pF

Related parts for k9f1208u0a-y