SST49LF004B-33-4C-EI SST [Silicon Storage Technology, Inc], SST49LF004B-33-4C-EI Datasheet - Page 28

no-image

SST49LF004B-33-4C-EI

Manufacturer Part Number
SST49LF004B-33-4C-EI
Description
4 Mbit LPC Firmware Flash
Manufacturer
SST [Silicon Storage Technology, Inc]
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST49LF004B-33-4C-EI
Manufacturer:
SST
Quantity:
20 000
Data Sheet
TABLE 21: I
TABLE 22: R
©2003 Silicon Storage Technology, Inc.
Symbol
V
V
V
V
Input Signal Edge Rate
T
T
T
T
T
T
PRST
KRST
RSTP
RSTF
RST
RSTE
TH
TL
TEST
MAX
FIGURE 11: R
1. The input test environment is done with 0.1 V
1. There will be a latency due to T
Symbol
1
1
1
drive than this. V
different voltage values, but must correlate results back to these parameters.
1
RST#/INIT#
LFRAME#
LAD[3:0]
V
CLK
NTERFACE
DD
ESET
Parameter
V
Clock Stable to Reset Low
RST# Pulse Width
RST# Low to Output Float
RST# High to LFRAME# Low
RST# Low to reset during Sector-/Block-Erase or Program
DD
ESET
MAX
stable to Reset Low
T
IMING
specifies the maximum peak-to-peak waveform allowed for measuring input timing. Production testing may use
T
M
IMING
EASUREMENT
P
ARAMETERS
D
RSTE
IAGRAM
if a reset procedure is performed during a Program or Erase operation,
T
C
PRST
, V
(LPC M
ONDITION
DD
DD
T
of overdrive over V
KRST
=3.0-3.6V (LPC M
ODE
P
ARAMETERS
)
28
IH
T
and V
0.6 V
0.2 V
0.4 V
0.4 V
RSTF
Value
ODE
(LPC M
1
IL
DD
DD
DD
DD
. Timing parameters must be met with no more over-
)
T
RSTP
T
ODE
RSTE
Min
100
100
1
1
)
4 Mbit LPC Firmware Flash
T
RST
Max
48
10
or Program operation
Sector-/Block-Erase
SST49LF004B
Units
aborted
V/ns
1232 F08.0
S71232-02-000
V
V
V
V
Units
ms
µs
ns
ns
µs
µs
T21.0 1232
T22.0 1232
12/03

Related parts for SST49LF004B-33-4C-EI