AT89C51ED2-SMSIM ATMEL Corporation, AT89C51ED2-SMSIM Datasheet - Page 13

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AT89C51ED2-SMSIM

Manufacturer Part Number
AT89C51ED2-SMSIM
Description
8-bit Flash Microcontroller
Manufacturer
ATMEL Corporation
Datasheet

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Part Number:
AT89C51ED2-SMSIM
Manufacturer:
ATMEL
Quantity:
385
The best fit coefficients in the regression analysis are:
T0= 14.25034317 LN-sec
Ea= 1.060043152 eV
GAMMA= -3.2454227 LN-sec-cm/MV
SIGMA= 0.414655753 LN-sec
with an adjusted r-squared of 97.99%. The intrinsic lifetime at use conditions calculated from this regression is
56174 years.
Conclusion:
Using the coefficients determined above, the time to reach any cumulative percent failure level can be estimated
given the stress conditions. Using 105C and 3.3 volts on 63 Angstrom N-Channel gate2 oxide, we may expect
0.01% of capacitors having 6,267 square microns area with 6,174 microns of active edge to fail in about 613 years,
exceeding the technology requirement of ten years.
Test results :
Rev. 0 – 2003 July
-1,00000E+00
-2,00000E+00
-1,00000E+00
-2,00000E+00
2,00000E+00
1,00000E+00
0,00000E+00
2,00000E+00
1,00000E+00
0,00000E+00
AT56.8K Active Edge TDDB 225C
AT56.8K Active Edge TDDB 175C
E+00
E+00
1,00
1,00
E+01
E+01
1,00
1,00
E+02
E+02
1,00
1,00
Tbd (sec)
Tbd (sec)
E+03
E+03
1,00
1,00
E+04
E+04
1,00
1,00
E+05
E+05
1,00
1,00
AT89C51RD2 / AT89C51ED2 QualPack
-1,00000E+00
-2,00000E+00
2,00000E+00
1,00000E+00
0,00000E+00
AT56.8K Active Edge TDDB 200C
E+00
1,00
E+01
1,00
E+02
1,00
Tbd (sec)
E+03
1,00
E+04
1,00
E+05
1,00
13

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