AT89C51ED2-SMSIM ATMEL Corporation, AT89C51ED2-SMSIM Datasheet - Page 20

• Manufacturer Part Number: AT89C51ED2-SMSIM
• Description: 8-bit Flash Microcontroller
• Manufacturer: ATMEL Corporation

4.4.4 AT89C51ED2 Operating Reliability Calculation
In the next table, it is proposed a AT89C51ED2 reliability prediction calculated at 55°c for 60% confidence level
from generic test data collected over the 12 last months process monitor.
20
Lots
A00648
P01709
A00988B
A01459A
A01460E
A01615B
A01110C
A01110D
A01185F
A01366E
A01679A
A01679B
A00808A
A00943E
A01487Q
A02179
A01435H
A01435K
A02293C
A00960C
A01808A
A01914J
A01584A
Global
Device Type
T89C51CC01
VQFP 44
T89C51CC02
SOIC28
T89C51RC2
PLCC 44
T89C51RB2
PLCC 44
T85C5121
T89C5121
SSOP24
AT89C5114
SOIC20
AT89C51SND1
AT83C51SND1
VQFP 80
AT89C5131
VQFP64
Test Description
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
EFR Dynamic Life Test
LFR Dynamic Life Test
Step
1000h
1000h
1000h
1000h
1000h
1000h
1000h
1000h
AT89C51RD2 / AT89C51ED2 QualPack
48h
48h
48h
48h
48h
48h
48h
48h
48h
-
2/10674 187 ppm
Result
0/3787
1/1260
0/1856
0/1887
0/1316
0/266
0/280
0/100
0/300
0/100
0/684
0/100
0/200
1/550
0/170
0/350
0/100
Comment
1 Ipd drift caused by scratch on
metal 1
Consumption hot spot in DCLK
input buffer
4.4 fit
Rev. 0 – 2003 July