AT89C51ED2-SMSIM ATMEL Corporation, AT89C51ED2-SMSIM Datasheet - Page 7

• Manufacturer Part Number: AT89C51ED2-SMSIM
• Description: 8-bit Flash Microcontroller
• Manufacturer: ATMEL Corporation

4 Qualification
4.1 Qualification Methodology
All product qualifications are split into three distinct steps as shown below. Before a product is released for use,
successful qualification testing are required at wafer, device and package level.
Rev. 0 – 2003 July
- Wafer Level Reliability consists in testing individually basic process modules regarding their well known
- Device reliability is covering either dice design and processing aspects. The tests are performed on device
- For each package type proposed in the Datasheet, it is verified that qualification data are available. If not
potential limitations (Electro-migration, Hot Carriers Injection, Oxide Breakdown, NVM Data Retention).
Each test is performed using wafer process specific structures.
under qualification, but generic data may also be considered for reliability calculation.
qualification tests are carried out for the new package types. In addition, one package type is selected to
verify packaging reliability of the device under qualification.
Wafer Level
Reliability
(Design / Process)
Qualification
Reliability
Product
Device
AT89C51RD2 / AT89C51ED2 QualPack
Packaging
Reliability
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