MT54W1MH36B-4 MICRON [Micron Technology], MT54W1MH36B-4 Datasheet - Page 22

• Manufacturer Part Number: MT54W1MH36B-4
• Manufacturer: MICRON [Micron Technology]

TAP DC ELECTRICAL CHARACTERISTICS
0ºC £ T
NOTE:
36Mb: 1.8V V
MT54W2MH18B_A.fm - Rev 9/02
1.
2. Test conditions are specified using the load in Figure 10.
DESCRIPTION
Clock
Clock cycle time
Clock frequency
Clock HIGH time
Clock LOW time
Output Times
TCK LOW to TDO unknown
TCK LOW to TDO valid
TDI valid to TCK HIGH
TCK HIGH to TDI invalid
Setup Times
TMS setup
Capture setup
Hold Times
TMS hold
Capture hold
t
CS and
A
DD
£ +70ºC;
, HSTL, QDRIIb2 SRAM
t
CH refer to the setup and hold time requirements of latching data from the boundary scan register.
+1.7V £ V
Test Mode Select
Test Data-Out
Test Data-In
DD
Test Clock
£ +1.9V
(TDO)
(TMS)
(TCK)
(TDI)
4 MEG x 8, 4 MEG x 9, 2 MEG x 18, 1 MEG x 36
1
t MVTH
t DVTH
TAP Timing
2
t THTL
t THMX
t THDX
Figure 9
1,2
22
t
TLTH
3
1.8V V
t THTH
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DON’T CARE
SYMBOL
4
t
t
t
t
t
t
t
t
t
MVTH
THMX
THTH
DVTH
THDX
TLOX
TLOV
THTL
TLTH
t
DD
f
t
CH
TF
CS
t TLOX
, HSTL, QDRIIb2 SRAM
t TLOV
5
UNDEFINED
MIN
100
40
40
10
10
10
10
10
10
0
6
MAX
10
20
©2002, Micron Technology Inc.
ADVANCE
UNITS
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns