IDT72V51333L7-5BB8 IDT, Integrated Device Technology Inc, IDT72V51333L7-5BB8 Datasheet - Page 40

IC FLOW CTRL MULTI QUEUE 256-BGA

IDT72V51333L7-5BB8

Manufacturer Part Number
IDT72V51333L7-5BB8
Description
IC FLOW CTRL MULTI QUEUE 256-BGA
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet

Specifications of IDT72V51333L7-5BB8

Configuration
Dual
Density
512Kb
Access Time (max)
4ns
Word Size
18b
Organization
4Kx18x8
Sync/async
Synchronous
Expandable
Yes
Bus Direction
Uni-Directional
Package Type
BGA
Clock Freq (max)
133MHz
Operating Supply Voltage (typ)
3.3V
Operating Supply Voltage (min)
3.15V
Operating Supply Voltage (max)
3.45V
Supply Current
100mA
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
256
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
72V51333L7-5BB8
Cycle:
*A*
*AA* Device 0 is selected for the PAFn bus. The bus is currently providing status of a previously selected device X.
*B*
*BB* Queue 1 of device 0 is selected on the write port.
*C*
*CC* PAFn continues to show status of D0.
*D*
*DD* PAF[1] goes HIGH to show that D0 Q1 is not almost empty due to the read on cycle *C*.
*E*
*EE* Word, Wy+1 is written into D0 Q1.
*F*
*FF* PAF[1] and the discrete PAF flag go LOW to show the write on cycle *DD* causes Q1 of D0 to again go almost full.
*G*
IDT72V51333/72V51343/72V51353 3.3V, MULTI-QUEUE FLOW-CONTROL DEVICES
(8 QUEUES) 18 BIT WIDE CONFIGURATION 589,824, 1,179,648 and 2,359,296 bits
Device 0
Device 0
Queue 1 of device 0 is selected for read operations.
The last word in the output register is available on Qout. OE was previously taken LOW so the output bus is in Low-Impedance.
Word, Wx+1 is read out from the previous queue due to the FWFT effect.
The PAFn bus is updated with the device selected on the previous cycle, device 0 PAF[1] is LOW showing the status of queue 1.
The PAFn outputs of the device previously selected on the PAFn bus go to High-Impedance.
Device 7 is selected for the PAFn bus.
Word, Wd-m+1 is read from Q1 D0 due to the FWFT operation. This read is at the PAFn boundary of queue D0 Q1. This read will cause the PAF[1] output to go from
LOW to HIGH (almost full to not almost full), after a delay t
No read operations occur, REN is HIGH.
The active queue PAF flag of device 0 goes from High-Impedance to Low-Impedance.
Word, Wy is written into D0 Q1.
Queue 2 of Device 6 is selected for write operations.
Word, Wd-m+2 is read out due to FWFT operation.
Word, Wy+2 is written into D0 Q1.
Word, W0 is read from Q0 of D6, selected on cycle *E*, due to FWFT.
Prev.
Bus
WRADD
WADEN
RDADD
RADEN
WCLK
RCLK
ESTR
FSTR
PAFn
PAFn
PAFn
WEN
Qout
REN
PAF
Din
OE
t
Previous Device
Previous Device
QS
t
AS
t
t
STS
AS
000 0001
Device 0
D0Q1
t
OLZ
*A*
*AA*
Figure 23. PAF
000 xxxx
t
Prev. Q
t
t
AH
QH
STH
t
W
AH
X
t
QS
t
HIGH-Z
AS
PAF
PAF
PAF
PAF n - Direct Mode, Flag Operation – Devices in Expansion
HIGH - Z
*B*
D0 Q1
*BB*
t
A
SKEW3
t
t
STS
PAFHZ
t
t
AS
Prev. Q
t
PAFLZ
t
AH
QH
W
+ WCLK + tPAF. If t
X +1
Device 7
111 xxxx
*C*
Device 0
Device 0
*CC*
t
A
t
SKEW3
1
t
t
AH
STH
40
xxxxxx0x
xxxxxx0x
SKEW3
t
ENS
*D*
t
DS
Word W
is violated add an extra WCLK cycle.
D0 Q1
*DD*
2
t
QS
t
DH
y
W
D0 Q1
t
t
PAF
PAFLZ
D-M+1
110 0010
D6Q2
*E*
t
DS
D0 Q1
Device 0
Device 0
W
*EE*
y+1
t
QH
t
HIGH-Z
DH
xxxxxx1x
xxxxxx1x
*F*
COMMERCIAL AND INDUSTRIAL
t
DS
t
D0 Q1
A
W
*FF*
y+2
TEMPERATURE RANGES
W
t
D0 Q1
DH
D - M + 2
t
ENH
t
t
PAF
*G*
Device 0
WAF
Device 0 xxxxxx0x
t
A
xxxxxx0x
D6 Q2
W
5940 drw25
0

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