ADC1415S125/DB,598 NXP Semiconductors, ADC1415S125/DB,598 Datasheet - Page 35

• Manufacturer Part Number: ADC1415S125/DB,598
• Description: BOARD DEMO FOR ADC1415S125
• Manufacturer: NXP Semiconductors
• Type: A/Dr

Specifications of ADC1415S125/DB,598

• Number Of Adc's: 1
• Number Of Bits: 14
• Sampling Rate (per Second): 125M
• Data Interface: Serial, SPI™
• Inputs Per Adc: 1 Differential
• Input Range: 1 ~ 2 Vpp
• Power (typ) @ Conditions: 840mW @ 125Msps
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: ADC1415S125
• Product: Data Conversion Development Tools
• Conversion Rate: 125 MSPS
• Resolution: 14 bit
• Interface Type: SMA
• For Use With/related Products: ADC1415S125
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 568-5094

NXP Semiconductors
Table 26.
Default values are highlighted.
Table 27.
Default values are highlighted.
Table 28.
Default values are highlighted.
Table 29.
Default values are highlighted.
ADC1415S_SER
Product data sheet
Bit
2 to 0
Bit
7 to 0
Bit
7 to 2
1 to 0
Bit
7 to 4
3
2 to 0
Symbol
-
FASTOTR
FASTOTR_DET[2:0]
Symbol
TESTPAT_SEL[2:0]
Symbol
TESTPAT_USER[5:0]
-
Symbol
TESTPAT_USER[13:6]
Test pattern register 1 (address 0014h) bit description
Test pattern register 2 (address 0015h) bit description
Test pattern register 3 (address 0016h) bit description
Fast OTR register (address 0017h) bit description
Access
R/W
R/W
Access
R/W
Access
R/W
Access
R/W
All information provided in this document is subject to legal disclaimers.
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
Value
0000
0
1
000
001
010
011
100
101
110
111
Rev. 4 — 17 December 2010
Value
000
001
010
011
100
101
110
111
Value
000000
00
Value
00000000
Description
not used
fast Out-of-Range (OTR) detection
set fast OTR detect level
disabled
enabled
−20.56 dB
−16.12 dB
−11.02 dB
−7.82 dB
−5.49 dB
−3.66 dB
−2.14 dB
−0.86 dB
Description
digital test pattern select
Description
custom digital test pattern (bits 5 to 0)
not used
Description
custom digital test pattern (bits 13 to 6)
off
mid scale
−FS
+FS
toggle ‘1111..1111’/’0000..0000’
custom test pattern
‘1010..1010.’
‘010..1010’
…continued
ADC1415S series
© NXP B.V. 2010. All rights reserved.
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