AT91SAM9XE512-QU Atmel, AT91SAM9XE512-QU Datasheet - Page 64
![MCU ARM9 512K FLASH 208-PQFP](/photos/6/73/67311/313-208-pqfp_sml.jpg)
AT91SAM9XE512-QU
Manufacturer Part Number
AT91SAM9XE512-QU
Description
MCU ARM9 512K FLASH 208-PQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM9XE128-QU.pdf
(860 pages)
Specifications of AT91SAM9XE512-QU
Core Processor
ARM9
Core Size
16/32-Bit
Speed
180MHz
Connectivity
EBI/EMI, Ethernet, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
96
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
56K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 4x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
208-MQFP, 208-PQFP
Controller Family/series
AT91SAM9xxxxx
No. Of I/o's
96
Ram Memory Size
32KB
Cpu Speed
180MHz
No. Of Timers
2
Rohs Compliant
Yes
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
2-Wire, EBI, I2S, SPI, USART
Maximum Clock Frequency
180 MHz
Number Of Programmable I/os
96
Number Of Timers
6
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 4 Channel
Package
208PQFP
Device Core
ARM926EJ-S
Family Name
91S
Maximum Speed
180 MHz
Operating Supply Voltage
1.8|2.5|3.3 V
For Use With
AT91SAM9XE-EK - KIT EVAL FOR AT91SAM9XEAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT91SAM9XE512-QU
Manufacturer:
VISHAY
Quantity:
40 000
Company:
Part Number:
AT91SAM9XE512-QU
Manufacturer:
Atmel
Quantity:
58
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12.3.2
12.4
64
Debug and Test Pin Description
AT91SAM9XE128/256/512 Preliminary
Test Environment
Figure 12-3 on page 64
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
NTRST
TCK
TDI
TDO
TMS
RTCK
JTAGSEL
DRXD
DTXD
Debug and Test Pin List
AT91SAM9XE-based Application Board In Test
shows a test environment example. Test vectors are sent and inter-
Connector
ICE/JTAG
AT91SAM9XE
Interface
Function
Microcontroller Reset
Test Mode Select
Test Reset Signal
Test Clock
Test Data In
Test Data Out
Test Mode Select
Returned Test Clock
JTAG Selection
Debug Receive Data
Debug Transmit Data
JTAG
Chip n
ICE and JTAG
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Input/Output
Tester
Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Input
6254C–ATARM–22-Jan-10
Active Level
High
Low
Low
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