MC9S12DP512CPVER Freescale Semiconductor, MC9S12DP512CPVER Datasheet - Page 101

• Manufacturer Part Number: MC9S12DP512CPVER
• Description: IC MCU 16BIT 4K FLASH 112-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12DP512CPVER

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 25MHz
• Connectivity: CAN, I²C, SCI, SPI
• Peripherals: PWM, WDT
• Number Of I /o: 91
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 12K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 5.25 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 112-LQFP
• Package: 112LQFP
• Family Name: HCS12
• Maximum Speed: 25 MHz
• Operating Supply Voltage: 2.5|5 V
• Data Bus Width: 16 Bit
• Interface Type: CAN/I2C/SCI/SPI
• On-chip Adc: 2(8-chx10-bit)
• Number Of Timers: 8
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: MC9S12DP512CPVERTR

A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed
Conditions are shown in Table A-4 unless otherwise noted
Num C
NOTES:
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25 C for this product family, typical endurance at various temperature can
1
2
3
4
5
6
7
8
application.
to 25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer
to Engineering Bulletin EB619.
Javg
C
C
C
C
C
C
C
C
will not exeed 85 C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
Data retention after 10,000 program/erase cycles at
an average junction temperature of T
Data retention with <100 program/erase cycles at an
average junction temperature T
Number of program/erase cycles
(–40 C
Number of program/erase cycles
(0 C
Data retention after up to 100,000 program/erase
cycles at an average junction temperature of
T
Data retention with <100 program/erase cycles at an
average junction temperature T
Number of program/erase cycles
(–40 C
Number of program/erase cycles
(0 C < T
Javg
T
85 C
J
J
T
T
J
J
140 C)
140 C)
0 C)
0 C)
Table A-12 NVM Reliability Characteristics
Rating
Javg
Javg
EEPROM Reliability Characteristics
Flash Reliability Characteristics
Javg
85 C
85 C
85 C
Symbol
t
EEPRET
t
FLRET
n
n
EEP
FL
100,000
10,000
10,000
10,000
Min
15
20
15
20
MC9S12DP512 Device Guide V01.25
1
100,000
300,000
100
100
100
100
Typ
—
—
2
2
2
2
3
3
Max
—
—
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Unit
101