BUP314D Infineon Technologies, BUP314D Datasheet - Page 9

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BUP314D

Manufacturer Part Number
BUP314D
Description
IGBT 1200V 42A W/DIODE DUO-PK
Manufacturer
Infineon Technologies
Datasheets

Specifications of BUP314D

Package / Case
TO-218AB/5
Voltage - Collector Emitter Breakdown (max)
1200V
Vce(on) (max) @ Vge, Ic
3.2V @ 15V, 25A
Current - Collector (ic) (max)
42A
Power - Max
300W
Input Type
Standard
Mounting Type
Through Hole
Configuration
Single
Collector- Emitter Voltage Vceo Max
1200 V
Maximum Gate Emitter Voltage
+/- 20 V
Maximum Operating Temperature
+ 150 C
Continuous Collector Current Ic Max
42 A
Minimum Operating Temperature
- 55 C
Mounting Style
Through Hole
Lead Free Status / RoHS Status
Request inventory verification / Request inventory verification
Igbt Type
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Request inventory verification / Request inventory verification
Other names
BUP314DIN

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
BUP314D
Manufacturer:
SIEMENS
Quantity:
5 510
Part Number:
BUP314D
Manufacturer:
FSC
Quantity:
20 000
Power Semiconductors
14,0mJ
12,0mJ
10,0mJ
7mJ
6mJ
5mJ
4mJ
3mJ
2mJ
1mJ
0mJ
Figure 13. Typical switching energy losses
Figure 15. Typical switching energy losses
8,0mJ
6,0mJ
4,0mJ
2,0mJ
0,0mJ
E
E
10A
E
ts
off
on
*) E
*
*
due to diode recovery
*) E
50°C
on
T
as a function of collector current
(inductive load, T
V
Dynamic test circuit in Figure E)
as a function of junction
temperature
(inductive load, V
V
Dynamic test circuit in Figure E)
due to diode recovery
J
E
E
E
I
CE
GE
and E
on
,
C
off
ts
on
,
JUNCTION TEMPERATURE
=600V, V
=0/15V, I
and E
*
*
COLLECTOR CURRENT
20A
ts
include losses
ts
include losses
C
GE
100°C
=25A, R
=0/15V, R
30A
J
CE
=150°C,
=600V,
G
=22Ω,
G
40A
=22Ω,
150°C
TrenchStop
9
Figure 14. Typical switching energy losses
Figure 16. Typical switching energy losses
8 mJ
6 mJ
4 mJ
2 mJ
0 mJ
10mJ
®
9mJ
8mJ
7mJ
6mJ
5mJ
4mJ
3mJ
2mJ
1mJ
0mJ
Series
400V
E
E
V
E
ts
on
off
CE
*) E
*) E
*
*
due to diode recovery
as a function of gate resistor
(inductive load, T
V
Dynamic test circuit in Figure E)
as a function of collector emitter
voltage
(inductive load, T
V
Dynamic test circuit in Figure E)
,
due to diode recovery
on
CE
GE
COLLECTOR
on
500V
and E
=600V, V
=0/15V, I
and E
R
G
,
ts
GATE RESISTOR
ts
include losses
include losses
600V
-
C
GE
EMITTER VOLTAGE
=25A, R
IKW25T120
=0/15V, I
J
J
=150°C,
=150°C,
700V
G
Rev. 2.2 Sep 08
=22Ω,
C
=25A,
800V
E
E
E
on
ts
off
*
*

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