TXC-06412BROG Transwitch Corporation, TXC-06412BROG Datasheet - Page 150

• Manufacturer Part Number: TXC-06412BROG
• Manufacturer: Transwitch Corporation

Specifications of TXC-06412BROG

• Lead Free Status / Rohs Status: Compliant

PHAST-12P Device
DATA SHEET
TXC-06412B
PRELIMINARY TXC-06412B-MB, Ed. 2
June 2005
11.18.1 Bursty Distribution of Errors
11.18.2 Poisson Distribution of Errors
If a bursty distribution of errors is assumed, the excessive error defect is assumed to be false.
The degraded signal defect detection is based on one second performance monitoring block
error count.
Two sets of configuration registers are provided: one for setting the defect, one for clearing (to
allow some hysteresis).
The degraded signal defect (dDEG) is declared if DEG_DetectionWindowSize consecutive
bad intervals are detected - an interval is the one second period used for performance
monitoring. For B2 (MSOH) an interval is declared bad if the number of errored blocks in that
interval is greater than or equal to DEG_DetectionErrorThreshold. For B3 (POH) an interval
is declared bad if the number of errored blocks in that interval is greater than
DEG_DetectionErrorThreshold. Remark the slight difference between the B2 (MSOH) and
B3 (POH) detectors configuration!
The degraded signal defect (dDEG) is cleared if DEG_RecoveryWindowSize consecutive
good intervals are detected. An interval is declared good if the number of errored blocks in
that interval is smaller than DEG_RecoveryErrorThreshold.
The parameters DEG_DetectionWindowSize and DEG_RecoveryWindowSize are
provisionable in the range 2 to 10.
The threshold parameters DEG_DetectionErrorThreshold and DEG_RecoveryErrorThreshold
are to be provisioned as a number of errored blocks in the range of 0 < threshold <= Number
of blocks in the interval.
If a Poisson distribution of errors is assumed, both the degraded signal and the excessive
error defects need to be detected based on the accumulated BIP errors during intervals of
configurable duration.
For each defect, two sets of configuration registers are provided: one for setting the defect,
one for clearing (to allow some hysteresis).
The monitoring intervals for the degraded signal defect (dDEG) can be configured in steps of
time base T. The value of time base T can be set to 500
DEG_Use125usCounter configuration.
The degraded signal defect (dDEG) is declared if the accumulated BIP error count since the
start of the detection interval is greater than or equal to DEG_DetectionErrorThreshold
errors. The interval duration is DEG_DetectionWindowSize * T.
The degraded signal defect (dDEG) is cleared if the accumulated BIP error count during the
clearing interval is less than DEG_RecoveryErrorThreshold errors. The interval duration is
DEG_RecoveryWindowSize * T.
The monitoring intervals for the excessive error defect (dEXC) can be configured in steps of
time base T. The value of time base T can be set to 500
EXC_Use125usCounter configuration.
The excessive signal defect (dEXC) is declared if the accumulated BIP error count since the
start of the detection interval is greater than or equal to EXC_DetectionErrorThreshold
errors. The interval duration is EXC_DetectionWindowSize * T.
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