ATmega32 Atmel Corporation, ATmega32 Datasheet - Page 237
![no-image](/images/manufacturer_photos/0/0/79/atmel_corporation_sml.jpg)
ATmega32
Manufacturer Part Number
ATmega32
Description
Manufacturer
Atmel Corporation
Specifications of ATmega32
Flash (kbytes)
32 Kbytes
Pin Count
44
Max. Operating Frequency
16 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
32
Ext Interrupts
3
Usb Speed
No
Usb Interface
No
Spi
1
Twi (i2c)
1
Uart
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
15
Analog Comparators
1
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
2
Eeprom (bytes)
1024
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
2.7 to 5.5
Operating Voltage (vcc)
2.7 to 5.5
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
4
Input Capture Channels
1
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
ATmega32-16AC
Manufacturer:
COMPAL
Quantity:
500
Part Number:
ATmega32-16AU
Manufacturer:
ATMEL
Quantity:
20 000
Part Number:
ATmega32-16PI
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
Part Number:
ATmega32-16PU
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
2503Q–AVR–02/11
If the ADC is not to be used during scan, the recommended input values from
be used. The user is recommended not to use the Differential Gain stages during scan. Switch-
cap based gain stages require fast operation and accurate timing which is difficult to obtain
when used in a scan chain. Details concerning operations of the differential gain stage is there-
fore not provided.
The AVR ADC is based on the analog circuitry shown in
mation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is
usually to ensure that an applied analog voltage is measured within some limits. This can easily
be done without running a successive approximation algorithm: apply the lower limit on the digi-
tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit
on the digital DAC[9:0] lines, and verify the output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are shared with
a digital port pin as well.
When using the ADC, remember the following:
•
•
•
As an example, consider the task of verifying a 1.5V ±5% input signal at ADC channel 3 when
the power supply is 5.0V and AREF is externally connected to V
The recommended values from
in
“Actions” describes what JTAG instruction to be used before filling the Boundary-scan Register
with the succeeding columns. The verification should be done on the data scanned out when
scanning in the data on the same row in the table.
Table
The Port Pin for the ADC channel in use must be configured to be an input with pull-up
disabled to avoid signal contention.
In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when
enabling the ADC. The user is advised to wait at least 200 ns after enabling the ADC before
controlling/observing any ADC signal, or perform a dummy conversion before using the first
result.
The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal
low (Sample mode).
92. Only the DAC and Port Pin values of the Scan-chain are shown. The column
The lower limit is:
The upper limit is:
Table 91
1024 1.5V 0,95 5V
1024 1.5V 1.05 5V
are used unless other values are given in the algorithm
⋅
⋅
⋅
⋅
⁄
⁄
Figure 123
=
=
291
323
CC
.
=
=
0x123
0x143
with a successive approxi-
ATmega32(L)
Table 91
should
237