MT58L1MY18P Micron Semiconductor Products, Inc., MT58L1MY18P Datasheet - Page 12

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MT58L1MY18P

Manufacturer Part Number
MT58L1MY18P
Description
18Mb Syncburst SRAM, 3.3V Vdd, 3.3V or 2.5V I/O; 2.5V Vdd, 2.5V I/O, Pipelined, Scd,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet

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Absolute Maximum Ratings
3.3V V
Voltage on V
Voltage on V
V
V
Storage Temperature (TQFP).................-55ºC to +150ºC
Storage Temperature (FBGA).................-55ºC to +125ºC
Junction Temperature .......................................... +150ºC
Short Circuit Output Current ...............................100mA
2.5V V
Voltage on V
Voltage on V
V
V
Storage Temperature (TQFP).................-55ºC to +150ºC
Storage Temperature (FBGA).................-55ºC to +125ºC
Junction Temperature .......................................... +150ºC
Short Circuit Output Current ...............................100mA
Table 8:
Notes appear following parameter tables on page 17; 0ºC £ T
noted
18Mb: 1 Meg x 18, 512K x 32/36, Pipelined, SCD SyncBurst SRAM
MT58L1MY18P1_16_D.fm – Rev. D, Pub 2/03
DESCRIPTION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output High Voltage
Output Low Voltage
Supply Voltage
Isolated Output Buffer Supply
IN
IN
IN
IN
Relative to V
Relative to V
Relative to V
Relative to V
(DQx) ....................................... -0.5V to V
(inputs) ....................................... -0.5V to V
(DQx) ....................................... -0.3V to V
(inputs) ....................................... -0.3V to V
DD
DD
DD
DD
DD
DD
3.3V V
SS
SS
SS
SS
Q Supply
Q Supply
Supply
Supply
....................................... -0.5V to +4.6V
....................................... -0.5V to +4.6V
....................................... -0.3V to +3.6V
....................................... -0.3V to +3.6V
DD
, 3.3V I/O DC Electrical Characteristics and Operating Conditions
Output(s) disabled,
0V
0V
CONDITIONS
I
OH
I
OL
£
£
= -4.0mA
= 8.0mA
V
V
DD
DD
IN
IN
DD
DD
£
£
Q + 0.5V
Q + 0.3V
V
V
+ 0.5V
+ 0.3V
DD
DD
12
A
PIPELINED, SCD SYNCBURST SRAM
£ +70ºC; V
SYMBOL
nent damage to the device. This is a stress rating only,
and functional operation of the device at these or any
other conditions above those indicated in the opera-
tional sections of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
package type, cycle time, loading, ambient tempera-
ture and airflow.
V
18Mb: 1 MEG x 18, 512K x 32/36
V
V
V
V
IL
V
DD
IL
Stresses greater than those listed may cause perma-
Maximum Junction Temperature depends upon
OH
DD
OL
IH
IL
O
I
Q
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD
and V
3.135
3.135
MIN
-0.3
-1.0
-1.0
2.0
2.4
DD
Q = 3.3V ±0.165V unless otherwise
V
DD
MAX
3.465
V
0.8
1.0
1.0
0.4
DD
+ 0.3
UNITS
µA
µA
V
V
V
V
V
V
©2003 Micron Technology, Inc.
NOTES
1, 2
1, 5
1, 2
4
1
1
1

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