lpc2917 NXP Semiconductors, lpc2917 Datasheet - Page 57

• Manufacturer Part Number: lpc2917
• Description: Arm9 Microcontroller With Can And Lin
• Manufacturer: NXP Semiconductors

NXP Semiconductors
Table 31.
V
respect to ground; positive currents flow into the IC; unless otherwise specified.
[1]
[2]
[3]
[4]
LPC2917_19_1
Preliminary data sheet
Symbol
t
UART
f
SPI
f
Jitter Specification
CANt
a(W)int
UART
SPI
DD(CORE)
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
This parameter is not part of production testing or final testing, hence only a typical value is stated.
Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully
stable.
Duty cycle clock should be as close as possible to 50%.
jit(cc)(p-p)
= V
Dynamic characteristics
DD(OSC_PLL)
Parameter
Internal write-access
time.
UART frequency.
SPI operating
frequency.
CAN TXD pin
Cycle-to-cycle jitter
(peak-to-peak value).
; V
DD(IO)
= 2.7 V to 3.6 V; V
…continued
Conditions
Master operation.
Slave operation.
[2]
Rev. 1.01 — 15 November 2007
DD(A3V3)
amb
= 25 qC (final testing). Both pre-testing and final testing use correlated
= 3.0 V to 3.6 V; T
ARM9 microcontroller with CAN and LIN
Min
-
1
1
1
-
e
e
e
65024
65024
65024
vj
=
f
f
f

clk(uart)
clk(spi)
clk(spi)
40
q
C; all voltages are measured with
Typ
-
-
-
-
0.4
LPC2917/19
Max
24.9
1
1
1
1
e
e
e
2
2
4
f
f
f
© NXP B.V. 2007. All rights reserved.
clk(uart)
clk(spi)
clk(spi)
amb
= 125 qC ambient
Unit
ns
MHz
MHz
MHz
ns
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