ST10F271E STMICROELECTRONICS [STMicroelectronics], ST10F271E Datasheet - Page 136

• Manufacturer Part Number: ST10F271E
• Description: 16-bit MCU with 128 Kbyte Flash memory and 8/12 Kbyte RAM
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Electrical characteristics
Table 65.
1. Two 64Kbyte Flash Sectors may be typically used to emulate up to 4, 8 or 16Kbyte of EEPROM. Therefore, in case of an
24.7
Table 66.
136/180
Analog Reference voltage 1)
Analog Ground voltage
Analog Input voltage 2)
Reference supply current
Sample time
Conversion time
Differential Non Linearity
Integral Non Linearity
Offset Error
Total unadjusted error
Coupling Factor between inputs 3) 7)
Input Pin Capacitance
Sampling Capacitance
Number of program / erase cycles
emulation of a 16Kbyte EEPROM, 100,000 Flash Program / Erase cycles are equivalent to 800,000 EEPROM
Program/Erase cycles. For an efficient use of the EEPROM Emulation please refer to dedicated Application Note document
(
representative to get copy of such a guideline document.
AN2061 - “EEPROM Emulation with ST10F2xx”
(-40°C ≤ T
6)
Flash data retention characteristics
A/D converter characteristics
A/D converter characteristics
V
V
Parameter
100,000
0 - 100
10,000
DD
SS
1,000
A
≤ V
= 5V ± 10%, V
≤ 125°C)
AGND
6)
6)
3) 8)
3) 8)
6)
≤ V
SS
+ 0.2V
SS
= 0V, T
V
V
V
I
t
t
DNL CC
INL CC
OFS CC
TUE CC
K
C
C
C
AREF
S
C
AREF
AGND
AIN
P1
P2
S
Symbol
256Kbyte (code store)
). Contact your local field service, local sales person or STMicroelectronics
SR
SR
SR
CC
CC
CC
CC
CC
CC
CC
A
= –40 to +125°C, 4.5V ≤ V
> 20 years
4.5
V
V
–
–
1
3
–1
–1.5
–1.5
–2.0
–5.0
–7.0
–
–
–
–
SS
AGND
-
-
-
min.
(average ambient temperature 60°C)
Limit Values
Data retention time
V
V
V
5
1
–
–
+1
+1.5
+1.5
+2.0
+5.0
+7.0
10
3
4
6
3.5
DD
SS
AREF
–6
max.
+ 0.2
AREF
64Kbyte (EEPROM emulation)
V
V
V
mA
µA
µs
µs
LSB
LSB
LSB
LSB
–
pF
pF
pF
Unit
≤ V
DD
ST10F271B/ST10F271E
,
Running mode
Power Down mode
4)
5)
No overload
No overload
No overload
Port5
Port1 - No overload
Port1 - Overload
On both Port5 and Port1
Port5
Port1
> 20 years
> 20 years
10 years
1 year
Test Condition
3)
3)
3)
(1)