ST72F63 STMICROELECTRONICS [STMicroelectronics], ST72F63 Datasheet - Page 104

• Manufacturer Part Number: ST72F63
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

ST7263B
13.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
13.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Figure 53. EMC Recommended star network power supply connection
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 F and 0.1 F decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance trade-off. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in other sections (I/Os, RESET, OSCx pin characteristics).
104/132
Symbol
V
V
FESD
FFTB
POWER
SUPPLY
SOURCE
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
V
DD
Parameter
DD
ST7
DIGITAL NOISE
FILTERING
and V
DD
pins
EXTERNAL
NOISE
FILTERING
10 F
V
V
conforms to IEC 1000-4-2
conforms to IEC 1000-4-4
DD
DD
0.1 F
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
0.1 F
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
Conditions
A
A
+25°C, f
+25°C, f
V
V
V
V
DD
SS
SSA
DDA
OSC
OSC
ST72XXX
8MHz
8MHz
2)
Neg
1.5
1.8
DD
1)
and V
Pos
1.8
1
SS
1)
through
Unit
kV