MT48H16M32LFCM-75 IT:A TR Micron Technology Inc, MT48H16M32LFCM-75 IT:A TR Datasheet - Page 24

IC SDRAM 512MBIT 133MHZ 90VFBGA

MT48H16M32LFCM-75 IT:A TR

Manufacturer Part Number
MT48H16M32LFCM-75 IT:A TR
Description
IC SDRAM 512MBIT 133MHZ 90VFBGA
Manufacturer
Micron Technology Inc
Type
Mobile SDRAMr

Specifications of MT48H16M32LFCM-75 IT:A TR

Format - Memory
RAM
Memory Type
Mobile SDRAM
Memory Size
512M (16M x 32)
Speed
133MHz
Interface
Parallel
Voltage - Supply
1.7 V ~ 1.95 V
Operating Temperature
-40°C ~ 85°C
Package / Case
90-VFBGA
Organization
16Mx32
Density
512Mb
Address Bus
15b
Access Time (max)
8/5.4ns
Maximum Clock Rate
133MHz
Operating Supply Voltage (typ)
1.8V
Package Type
VFBGA
Operating Temp Range
-40C to 85C
Operating Supply Voltage (max)
1.95V
Operating Supply Voltage (min)
1.7V
Supply Current
95mA
Pin Count
90
Mounting
Surface Mount
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
557-1329-2
Figure 11:
PDF: 09005aef81ca5de4/Source: 09005aef81ca5e03
MT48H32M16LF_1.fm - Rev. J 2/08 EN
READ Command
Notes:
A9, A11, A12
1. EN AP = enable auto precharge
Upon completion of a burst, assuming no other commands have been initiated, the DQs
will go High-Z.
Data from any READ burst may be truncated with a subsequent READ command, and
data from a fixed-length READ burst may be immediately followed by data from a READ
command. In either case, a continuous flow of data can be maintained. The first data
element from the new burst follows either the last element of a completed burst or the
last desired data element of a longer burst that is being truncated. The new READ
command should be issued x cycles before the clock edge at which the last desired data
element is valid, where x = CL -1.
Figure 7 on page 16 shows CLs of two and three; data element n + 3 is either the last of a
burst of four or the last desired of a longer burst. The 512Mb SDRAM uses a pipelined
architecture and therefore does not require the 2n rule associated with a prefetch archi-
tecture. A READ command can be initiated on any clock cycle following a previous
READ command. Full-speed random read accesses can be performed to the same bank,
as shown in Figure 12 on page 25, or each subsequent READ may be performed to a
different bank.
BA0, BA1
DIS AP = disable auto precharge
A0–A8
CAS#
A10
RAS#
WE#
CKE
CLK
CS#
1
HIGH
512Mb: 32 Meg x 16, 16 Meg x 32 Mobile SDRAM
COLUMN
ADDRESS
ADDRESS
DIS AP
EN AP
BANK
24
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Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2005 Micron Technology, Inc. All rights reserved.
Operations

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