MCIMX31LITEKITC Freescale Semiconductor, MCIMX31LITEKITC Datasheet - Page 12

BOARD DEV FOR I.MX31

MCIMX31LITEKITC

Manufacturer Part Number
MCIMX31LITEKITC
Description
BOARD DEV FOR I.MX31
Manufacturer
Freescale Semiconductor
Type
MCUr
Datasheet

Specifications of MCIMX31LITEKITC

Contents
Module and Misc Hardware
For Use With/related Products
i.MX31
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Electrical Characteristics
12
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal
2. Junction-to-Ambient Thermal Resistance determined per JEDEC JESD51-3 and JESD51-6.
3. Junction-to-Board thermal resistance determined per JEDEC JESD51-8. Thermal test board
4. Junction-to-Case at the top of the package determined using MIL-STD 883 Method 1012.1. The
5. Thermal characterization parameter indicating the temperature difference between the package
resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of
other components on the board, and board thermal resistance.
Thermal test board meets JEDEC specification for this package.
meets JEDEC specification for the specified package.
cold plate temperature is used for the case temperature. Reported value includes the thermal
resistance of the interface layer.
top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the
thermal characterization parameter is written as Psi-JT.
MCIMX31/MCIMX31L Technical Data, Rev. 4.1
NOTES
Freescale Semiconductor

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