a3p250l Actel Corporation, a3p250l Datasheet - Page 47

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a3p250l

Manufacturer Part Number
a3p250l
Description
Proasic3l Low-power Flash Fpgas With Flash*freeze Technology
Manufacturer
Actel Corporation
Datasheet

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Table 2-39 • Short Current Event Duration before Failure
Table 2-40 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
110°C
Input Buffer
LVTTL/LVCMOS
LVDS/BLVDS/
M-LVDS/LVPECL
*
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is low,
then the rise time and fall time of input buffers can be increased beyond the maximum value. The longer the
rise/fall times, the more susceptible the input signal is to the board noise. Actel recommends signal integrity
evaluation/characterization of the system to ensure that there is no excessive noise coupling into input signals.
Input Rise/Fall Time (min.)
No requirement
No requirement
A dv a n c e v 0. 4
Input Rise/Fall Time (max.)
Time before Failure
10 ns *
10 ns *
> 20 years
> 20 years
> 20 years
6 months
3 months
5 years
2 years
ProASIC3L DC and Switching Characteristics
20 years (110°C)
10 years (100°C)
Reliability
2 - 35

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