R5F21237DFP#U0 Renesas Electronics America, R5F21237DFP#U0 Datasheet - Page 436
![IC R8C/23 MCU FLASH 48-LQFP](/photos/12/18/121887/r5f21237dfp_u0_sml.jpg)
R5F21237DFP#U0
Manufacturer Part Number
R5F21237DFP#U0
Description
IC R8C/23 MCU FLASH 48-LQFP
Manufacturer
Renesas Electronics America
Series
R8C/2x/23r
Specifications of R5F21237DFP#U0
Core Processor
R8C
Core Size
16/32-Bit
Speed
20MHz
Connectivity
CAN, I²C, LIN, SIO, SSU, UART/USART
Peripherals
POR, Voltage Detect, WDT
Number Of I /o
41
Program Memory Size
48KB (48K x 8)
Program Memory Type
FLASH
Ram Size
2.5K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 12x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LQFP
For Use With
RCDK8C - KIT DEV EVAL FOR CAN R8C/23R0K521237S000BE - KIT DEV RSK R8C/23R0E521237CPE00 - EMULATOR COMPACT R8C/20/21/22/23
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
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R8C/22 Group, R8C/23 Group
Rev.2.00 Aug 20, 2008
REJ09B0251-0200
20. Flash Memory
20.1
Table 20.1
NOTES:
Flash Memory Operating Mode
Division of Erase Block
Program Method
Erase Method
Program, Erase Control Method
Rewrite Control Method
Number of Commands
Programming
and erase
endurance
ID Code Check Function
ROM Code Protect
In the flash memory version, rewrite operations to the flash memory can be performed in three modes; CPU
rewrite, standard serial I/O, parallel I/O modes.
Table 20.1 lists the Flash Memory Performance (see Table 1.1 and Table 1.2 Performance for the items not listed
on Table 20.1).
1. Definition of programming and erasure endurance
2. Blocks A and B are embedded only in the R8C/23 Group.
The programming and erasure endurance is defined on a per-block basis.
If the programming and erasure endurance is n (n = 100 or 10,000), each block can be erased n
times. For example, if 1,024 1-byte writes are performed to different addresses in block A, a 1-Kbyte
block, and then the block is erased, the programming/erasure endurance still stands at one. When
performing 100 or more rewrites, the actual erasure endurance can be reduced by executing
programming operations in such a way that all blank areas are used before performing an erase
operation. Avoid rewriting only particular blocks and try to average out the programming and erasure
endurance of the blocks. It is also advisable to retain data on the erasure endurance of each block
and limit the number of erase operations to a certain number.
Overview
(1)
Flash Memory Performance
Item
Blocks 0 and 1
(Program ROM)
Blocks A and B
(Data Flash)
Page 414 of 501
(2)
3 modes (CPU rewrite, standard serial I/O, and parallel I/O mode)
See Figure 20.1 and Figure 20.2
Byte unit
Block erase
Program and erase control by software command
Rewrite control for blocks 0 and 1 by FMR02 bit in FMR0 register
Rewrite control for block 0 by FMR16 bit and block 1 by FMR16 bit
5 commands
R8C/22 Group: 100 times; R8C/23 Group: 1,000 times
10,000 times
Standard serial I/O mode supported
For parallel I/O mode supported
Specification
20. Flash Memory
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