DEMO9S08LIN Freescale, DEMO9S08LIN Datasheet - Page 349

• Manufacturer Part Number: DEMO9S08LIN
• Manufacturer: Freescale

Specifications of DEMO9S08LIN

• Lead Free Status / RoHS Status: Compliant

A.12.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient signal on each pin of the
microcontroller. The transient waveform and injection methodology is in accordance with IEC 61000-4-4
for the electrical fast transient/burst (EFT/B). The transient voltage required to cause performance
degradation on any pin in the tested configuration is greater than or equal to the reported levels unless
otherwise indicated by footnotes below the table.
The susceptibility performance classification is described in
Freescale Semiconductor
NOTES:
1. This data based on qualification test results. Not tested in production.
2. The reported transient immunity voltage ;levels indicate the minimum voltage range for each result type.
Package
80LQFP
Result
A
B
C
D
E
Conducted Transient Susceptibility
Voltage
Supply
Self-recovering
[V]
2.2
Hard failure
Soft failure
No failure
Table A-17. Conducted Transient Susceptibility Characteristics
Damage
failure
Table A-18. Susceptibility Performance Classification
Ambient
MC9S08LC60 Series Data Sheet: Technical Data, Rev. 4
Temp.
[
o
25
C]
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
External crystal,
Frequency
Oscillator
Source &
32 kHz
Performance Criteria
System Bus
Frequency
20 MHz
Table
A-18.
Result
C
D
A
B
E
Appendix A Electrical Characteristics
1
Amplitude
[Typical]
Level
none
none
none
none
+/- 4
2
Unit
kV
349