TWR-K60N512-KEIL Freescale Semiconductor, TWR-K60N512-KEIL Datasheet - Page 149

• Manufacturer Part Number: TWR-K60N512-KEIL
• Description: K60N512 Keil Tower Kit
• Manufacturer: Freescale Semiconductor
• Series: Kinetisr
• Type: MCUr

Specifications of TWR-K60N512-KEIL

• Rohs Compliant: YES
• Contents: 4 Boards, Documentation, DVD
• Peak Reflow Compatible (260 C): Yes
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• For Use With/related Products: Freescale Tower System, K60N512

Chapter 16
Segment LCD Controller
16.1 Overview
This document explains how to use the segment LCD controller (SLCD) for the Kinetis
family. It includes module initialization, power supply, clock source, load adjustment,
frame frequency interrupts, and the use of features as blinking, alternate display, segment
fault detection, and using the module on low power modes.
16.1.1 Introduction
The segment LCD module (SLCD) generates all the waveforms required for an LCD.
The SLCD module supports up to 64 pins. The K40 family implements up to 48 LCD
pins. Eight of them can be configured as COM or backplane allowing control of up to 8 x
40 = 320 segments.
The power supply for the LCD can be selected from different options depending on the
LCD panel voltage, the application environment, and the way the contrast control is
required. The SLCD has a charge pump that allows to control both 3 V and 5 V LCD
panels.
Automatic blinking and the capacity to display two messages in alternate mode without
refreshing the segments (when less than five backplanes are used) are available. These
features can be used to simplify the code and reduce power consumption in low power
modes.
Segment fault detection is now possible by measuring the capacitance in each pin of the
LCD. The module measures the capacitance of each pin including cables, connector, and
the LCD panel. A reference capacitance must be determined when the LCD is operating
correctly and stored in the memory. While the product is operating, the capacitance can
be compared periodically to verify if there’s an open connection, short circuit, or a
substantial change in the reference capacitance that indicates a fault.
Kinetis Quick Reference User Guide, Rev. 0, 11/2010
Freescale Semiconductor
149