MT55L1MY18F Micron Semiconductor Products, Inc., MT55L1MY18F Datasheet - Page 27
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MT55L1MY18F
Manufacturer Part Number
MT55L1MY18F
Description
18Mb ZBT SRAM, 3.3V Vdd, 2.5V or 3.3V I/O; 2.5V Vdd, 2.5V I/O, Flow-Through,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet
1.MT55L1MY18F.pdf
(34 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT55L1MY18FF-10 ES
Manufacturer:
MICRON/美光
Quantity:
20 000
Part Number:
MT55L1MY18FF-12
Manufacturer:
MICRON/美光
Quantity:
20 000
Part Number:
MT55L1MY18FF-12 ES
Manufacturer:
MICRON/美光
Quantity:
20 000
3.3V TAP AC Test Conditions
Input Pulse Levels .......................................... Vss to 3.0V
Input rise and fall times ..............................................1ns
Input timing reference levels.................................... 1.5V
Output reference levels ............................................. 1.5V
Test load termination supply voltage ...................... 1.5V
Table 20: 3.3V V
0ºC £ T
Table 21: 2.5V V
0ºC £ T
NOTE:
18Mb: 1 Meg x 18, 512K x 32/36 Flow-through ZBT SRAM
MT55L1MY18F_16_D.fm – Rev. D, Pub. 2/03
1. All voltages referenced to V
2. TAP control balls only. For boundary scan ball specifications, please refer to the I/O DC Electrical Characteristics and
DESCRIPTION
DESCRIPTION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
3.3V TAP AC Output Load Equivalent
Operation Conditions tables.
A
A
£ +70ºC; V
£ +70ºC; V
TDO
DD
DD
= 3.3V ±0.165V unless otherwise noted
= 2.5V ±0.125V unless otherwise noted
Figure 18:
Z = 50
O
DD
DD
, TAP DC Electrical Characteristics and Operating Conditions
, TAP DC Electrical Characteristics and Operating Conditions
SS
(GND).
0V £ V
0V £ V
1.5V
Output(s) disabled,
Output(s) disabled,
0V £ V
CONDITIONS
I
0V £ V
CONDITIONS
I
I
OHC
I
OHC
I
OLC
I
OLC
I
OHT
I
OHT
20pF
OLT
50
OLT
IN
IN
= -100µA
= 100µA
= -100µA
£ V
= 100µA
£ V
= 2mA
= -2mA
= -2mA
= 2mA
IN
IN
£ V
DD
£ V
DD
(TDO)
DD
(TDO)
DD
27
SYMBOL
SYMBOL
2.5V TAP AC Test Conditions
Input Pulse Levels........................................... Vss to 2.5V
Input rise and fall times ............................................. 1ns
Input timing reference levels.................................. 1.25V
Output reference levels ........................................... 1.25V
Test load termination supply voltage .................... 1.25V
18Mb: 1 MEG x 18, 512K x 32/36
V
V
V
V
V
V
V
V
2.5V TAP AC Output Load Equivalent
V
V
IL
V
IL
IL
V
OH1
OH2
OL1
OL2
IL
OH1
OH2
OL1
OL2
IH
IL
IH
O
IL
O
I
I
Micron Technology, Inc., reserves the right to change products or specifications without notice.
FLOW-THROUGH ZBT SRAM
TDO
MIN
MIN
-0.3
-10
-10
-0.3
2.0
2.9
2.0
-10
-10
1.7
2.1
1.7
Figure 19:
Z = 50
O
V
V
DD
DD
MAX
MAX
0.8
0.7
0.8
10
10
0.2
0.7
0.7
10
10
+ 0.3
+ 0.3
1.25V
UNITS
UNITS
µA
µA
µA
µA
V
V
V
V
V
V
V
V
V
V
V
V
©2003 Micron Technology, Inc.
20pF
50
NOTES
NOTES
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
2
2
2
2