IDT71P73804 Integrated Device Technology, IDT71P73804 Datasheet - Page 13

• Manufacturer Part Number: IDT71P73804
• Description: 1.8v 1m X 18 Ddr Ii Pipelined Sram
• Manufacturer: Integrated Device Technology

Input Electrical Characteristics Over the Operating Temperature and
Supply Voltage Range
NOTES:
1. These are DC test criteria. DC design criteria is VREF + 50mV. The AC VIH/VIL levels are defined separately for measuring timing parameters.
2. VIH (Max) DC = VDDQ+0.3, VIH (Max) AC = VDD +0.5V (pulse width <20% tKHKH (min))
3. VIL (Min) DC = -0.3V, VIL (Min) AC = -0.5V (pulse width <20% tKHKH (min))
4. This conditon is for AC function test only, not for AC parameter test.
5. To maintain a valid level, the transitioning edge of the input must:
Overshoot Timing
V
V
a) Sustain a constant slew rate from the current AC level through the target AC level, VIL(AC) or VIH(AC)
b) Reach at least the target AC level.
c) After the AC target level is reached, continue to maintain at least the target DC level, VIL(DC) or VIH(DC)
18 Mb DDR II SRAM Burst of 4
DD
DD
IDT71P73204 (2M x 8-Bit), 71P73104 (2M x 9-Bit), 71P73804 (1M x 18-Bit) 71P73604 (512K x 36-Bit)
Voltage, DC
Voltage, DC
Voltage, AC
Voltage, AC
+0.5
+0.25
Parameter
Input High
Input High
Input Low
Input Low
V
V
DD
IL
Symbol
V
V
V
V
IH (DC
IH (AC)
IL (DC)
IL (AC)
)
20% tKHKH (MIN)
V
V
REF
REF
Min
-0.3
-
+0.1
+0.2
V
V
V
(V
DDQ
REF
REF
Max
DD
-
+0.3
-0.2
-0.1
= 1.8 ± 100mV, V
Unit
V
V
V
V
6431 drw 21
6431 tbl 10d
Notes
4,5
4,5
1,2
1,3
DDQ
6.42
13
= 1.4V to 1.9V)
Undershoot Timing
V
V
SS
SS
-0.25V
-0.5V
V
V
SS
IH
20% tKHKH (MIN)
Commercial Temperature Range
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