IDT71P73804 Integrated Device Technology, IDT71P73804 Datasheet - Page 14

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IDT71P73804

Manufacturer Part Number
IDT71P73804
Description
1.8v 1m X 18 Ddr Ii Pipelined Sram
Manufacturer
Integrated Device Technology
Datasheet

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Input Waveform
Output Waveform
AC Test Load
AC Test Conditions
NOTE:
1. Parameters are tested with RQ=250Ω
(V
Core Power Supply Voltage
Output Power Supply Voltage
Input High Level
Input Low Level
Input Reference Level
Input Rise/Fall Time
DQ Rise/Fall Time
Output Timing Reference Level
(V
18 Mb DDR II SRAM Burst of 4
IDT71P73204 (2M x 8-Bit), 71P73104 (2M x 9-Bit), 71P73804 (1M x 18-Bit) 71P73604 (512K x 36-Bit)
DDQ
DDQ
/2) + 0.5V
/2) - 0.5V
Parameter
OUTPUT
Device
Under
Test
V
V
DDQ
REF
ZQ
/2
V
DDQ
V
Test points
Z
R
DDQ
/2
0
Q
Symbol
=50 Ω
VREF
TR/TF
/2
V
V
V
V
= 250 Ω
DDQ
DD
IH
IL
Test points
6431 drw 10
(V
(V
DDQ
V
DDQ
V
V
1.7-1.9
1.4-1.9
0.3/0.3
0.5/0.5
V
Value
DDQ
DDQ
DDQ
6431 drw 08
/2) + 0.5
DDQ
/2) - 0.5
/2
/2
/2
V
R
6431 drw 07
/2
DDQ
L
= 50 Ω
/2
Unit
6431 tbl 11a
ns
V
V
V
V
V
V
6.42
14
Commercial Temperature Range

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