TN28F010-150 Intel Corporation, TN28F010-150 Datasheet - Page 25

• Manufacturer Part Number: TN28F010-150
• Description: 28F010 1024K (128K X 8) CMOS FLASH MEMORY
• Manufacturer: Intel Corporation

AC test inputs are driven at V
and V
V
and V
NOTE:
1.
4.8
NOTES:
1.
2.
3.
4.
0.45
2.4
IH
t
t
t
t
t
t
t
t
t
t
AVAV
ELQV
AVQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
OH
WHGL
Figure 6. Testing Input/Output Waveform
Symbol
(2.0 V
Testing characteristics for 28F010-90, 28F010-120, and
28F010-150.
See AC Input/Output Waveform and AC Testing Load Circuit for testing characteristics.
Sampled, not 100% tested.
Guaranteed by design.
Whichever occurs first.
OL
IL
. Input rise and fall times (10% to 90%) 10 ns.
Input
/t
/t
/t
/t
/t
/t
/t
(0.45 V
RC
CE
LZ
ACC
OE
OLZ
TTL
DF
AC Characteristics—Read-Only Operations—Commercial and Extended
Temperature Products
) and V
Read Cycle Time
CE# Access Time
Address Access Time
OE# Access Time
CE# to Low Z
Chip Disable to Output in
High Z
OE# to Output in Low Z
Output Disable to Output in
High Z
Output Hold from Address,
CE#, or OE# Change
Write Recovery Time before
Read
TTL
2.0
0.8
) for a Logic “0”. Input timing begins at
IL
Versions
(0.8 V
Characteristic
Test Points
TTL
OH
). Output timing ends at V
(2.4 V
TTL
) for a Logic “1”
2.0
0.8
Output
Notes
2, 3
2, 3
2, 4
(1)
2
2
0207_06
IH
28F010-90
Min
90
0
0
0
6
C
L
Includes Jig Capacitance
Under Test
Max
90
90
35
45
30
Device
(1)
Figure 7. AC Testing Load Circuit
28F010-120
Min
120
0
0
0
6
Max
120
120
50
55
30
(1)
1.3V
28F010-150
Min
150
R
0
0
0
6
C
L
1N914
L
= 3.3 k
= 100 pF
Max
150
150
55
55
35
(1)
28F010
Out
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
0207_07
25