SST89E554 SST [Silicon Storage Technology, Inc], SST89E554 Datasheet - Page 49

• Manufacturer Part Number: SST89E554
• Description: FlashFlex51 MCU
• Manufacturer: SST [Silicon Storage Technology, Inc]

FlashFlex51 MCU
SST89E564 / SST89V564 / SST89E554 / SST89V554
Preliminary Specifications
TABLE 10-4: DC E
©2001 Silicon Storage Technology, Inc.
Symbol
V
V
V
V
V
V
V
V
V
I
I
I
R
C
I
IL
TL
LI
DD
IL
IH
IH1
OL
OL
OL1
OH
OH1
BOD
RST
IO
1. Under steady state (non-transient) conditions, I
2. Capacitive loading on Ports 0 & 2 may cause spurious noise to be superimposed on the V
3. Load capacitance for Port 0, ALE & PSEN#= 100pF, load capacitance for all other outputs = 80pF.
Maximum I
Maximum I
Maximum I
If I
listed test conditions.
to external bus capacitance discharging into the Port 0 & 2 pins when the pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to
qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.
OL
exceeds the test condition, V
Parameter
Input Low Voltage
Input High Voltage
Input High Voltage (XTAL1, RST)
Output Low Voltage (Ports 1.5, 1.6, 1.7)
Output Low Voltage (Ports 1, 2, 3)
Output Low Voltage (Port 0, ALE, PSEN#)
Output High Voltage (Ports 1, 2, 3, ALE, PSEN#)
Output High Voltage (Port 0 in External Bus Mode)
Brown-out Detection Voltage
Logical 0 Input Current (Ports 1, 2, 3)
Logical 1-to-0 Transition Current (Ports 1, 2, 3)
Input Leakage Current (Port 0)
RST Pulldown Resistor
Pin Capacitance
Power Supply Current
In-Application Mode
Active Mode
Idle Mode
Standby (Stop Clock) Mode
Power Down Mode
OL
OL
OL
T
per port pin:
per 8-bit port:
total for all outputs: 71mA
amb
= 0°C
LECTRICAL
6
TO
7
+70°C
15mA
26mA
C
OH
HARACTERISTICS
may exceed the related specification. Pins are not guaranteed to sink current greater than the
OR
1
-40°C
OL
must be externally limited as follows:
TO
1,3
+85°C, 25MH
5
4
4
49
T
T
0.45 < V
T
T
amb
amb
Minimum V
amb
amb
Test Conditions
@ 1 MHz, 25°C
2.7 < V
2.7 < V
2.7 < V
I
I
I
I
I
I
I
Z DEVICES
= -40°C to +85°C
= -40°C to +85°C
OL
OL
OL
OL
OL
I
I
I
OH
OH
I
V
V
V
V
V
OH
OH
OH
V
OL
= 0°C to +70°C
= 0°C to +70°C
V
DD
DD
DD
DD
DD
IN
= 100µA
= 1.6mA
= 3.5mA
= 200µA
= 3.2mA
IN
= -200µA
= -3.2mA
= 16mA
= -10µA
= -30µA
= -60µA
IN
= 0.4V
= 2.7V
= 2.7V
= 2.7V
= 2.7V
= 2.7V
DD
DD
DD
= 2V
< V
DD
< 3.3
< 3.3
< 3.3
DD
; 2.7-3.6V; V
= 2V
2
2
2
2
2
-0.3
OL
s of ALE and Ports 1 & 3. The noise due
0.2V
V
V
V
V
V
0.7V
DD
DD
DD
DD
DD
2.25
Min
-0.5
DD
SS
-1
- 0.3
- 0.7
- 1.5
- 0.3
- 0.7
DD
+ 0.9
= 0V
V
V
S71181-03-000 9/01
DD
DD
Max
0.45
0.45
2.55
-650
±10
225
0.7
1.0
0.3
1.0
0.3
-75
6.5
15
70
22
70
88
40
50
+ 0.5
+ 0.5
T10-4.4 384
Units
mA
mA
mA
µA
µA
µA
k
µA
µA
µA
µA
pF
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
384